Abrasive-Free Polishing of Single-Crystal 4H-SiC with Silica Glass Plates

2015 ◽  
Vol 4 (12) ◽  
pp. P468-P475 ◽  
Author(s):  
Akihisa Kubota ◽  
Yuta Hatasako ◽  
Takahiro Takita ◽  
Mutsumi Touge
Keyword(s):  
Single Crystal ◽  
Silica Glass ◽  
Glass Plates

scholarly journals Terahertz and Microwave Optical Properties of Single-Crystal Quartz and Vitreous Silica and the Behavior of the Boson Peak

2021 ◽  
Vol 11 (15) ◽  
pp. 6733
Author(s):  
Mira Naftaly ◽  
Andrew Gregory
Keyword(s):  
Single Crystal ◽  
Silica Glass ◽  
Broad Band ◽  
Peak Frequency ◽  
Vitreous Silica ◽  
Peak Height ◽  
Fused Silica ◽  
Boson Peak ◽  
Single Crystal Quartz ◽  
Crystal Quartz

Z-cut single-crystal quartz and vitreous silica (silica glass or fused silica) were evaluated for use as reference materials for terahertz and microwave measurements of complex permittivity, with Z-cut quartz confirmed as being suitable. Measurements of refractive indices and absorption coefficients for o-ray and e-ray in quartz and for vitreous silica are reported at frequencies between 0.2 and 6 THz and at 36 and 144 GHz, and compared with data reported in the literature. A previously unreported broad band was seen in the extraordinary absorption of quartz. The Boson peak in silica glass absorption was examined, and for the first time, two negative relationships have been observed: between the refractive index and the Boson peak frequency, and between the Boson peak height and its frequency.

Structure of Thin Sol-Gel Coatings Near The Surface of Substrates

1992 ◽  
Vol 271 ◽  
Author(s):  
Hiroshi Hirashima ◽  
Takao Kusaka
Keyword(s):  
Refractive Index ◽  
Silica Glass ◽  
Sol Gel ◽  
Dip Coating ◽  
Oxide Coatings ◽  
Gel Method ◽  
Sol Gel Method ◽  
Glass Substrates ◽  
Interface Dynamic ◽  
Glass Plates

ABSTRUCTThe sol-gel method is one of the most appropriate technologies for the preparation of functional thin oxide coatings. However, few studies on the structure near the interface between sol-gel coatings and substrates have been reported. In this study, the structures of thin TiO2 gel coatings were investigated by XPS in order to elucidate the interaction between the coatings and the glass substrates. TiO2 gel coatings were prepared from Ti-alkoxide by hydrolysis and dip-coating on silica glass plates. Thickness and refractive index measurements were made by ellipsometry. Changes in Ols spectra for the coatings were observed at locations near the interface. Dynamic microhardness measurements for the coatings and the coated glasses were made. These results suggest the formation of a Ti-O-Si bond at the interface.

NANO-MODIFICATION INSIDE TRANSPARENT MATERIALS BY FEMTOSECOND LASER SINGLE BEAM

2005 ◽  
Vol 19 (05) ◽  
pp. 225-238 ◽  
Author(s):  
YASUHIKO SHIMOTSUMA ◽  
KAZUYUKI HIRAO ◽  
JIARONG QIU ◽  
PETER G. KAZANSKY
Keyword(s):  
Femtosecond Laser ◽  
Single Crystal ◽  
Periodic Structure ◽  
Silica Glass ◽  
Incident Light ◽  
Polarization Direction ◽  
Low Oxygen ◽  
Tellurium Dioxide ◽  
Single Beam ◽  
Transparent Materials

Periodic nanostructures along the polarization direction of light are observed inside silica glasses and tellurium dioxide single crystal after irradiation by a focused single femtosecond laser beam. Backscattering electron images of the irradiated spot inside silica glass reveal a periodic structure of stripe-like regions of ~20 nm width with a low oxygen concentration. In the case of the tellurium dioxide single crystal, secondary electron images within the focal spot show the formation of a periodic structure of voids with ~30 nm width. Oxygen defects in a silica glass and voids in a tellurium dioxide single crystal are aligned perpendicular to the laser polarization direction. These are the smallest nanostructures below the diffraction limit of light, which are formed inside transparent materials. The phenomenon is interpreted in terms of interference between the incident light field and the electric field of electron plasma wave generated in the bulk of material.

Observation of Single-Crystal-Type EPR Spectra from Monolayers of Copper-Exchanged Zeolite Na-A Crystals Assembled on Glass Plates

2003 ◽  
Vol 107 (33) ◽  
pp. 8281-8284 ◽  
Author(s):  
Hyunsoo So ◽  
Kwang Ha ◽  
Yun-Jo Lee ◽  
Kyung Byung Yoon ◽  
R. Linn Belford
Keyword(s):  
Single Crystal ◽  
Epr Spectra ◽  
Crystal Type ◽  
Glass Plates

A Preparation of High Resolution Standards for Electron Microscopy. Part II

1971 ◽  
Vol 29 ◽  
pp. 160-161
Author(s):  
Akira Tanaka ◽  
David F. Harling
Keyword(s):  
Electron Microscopy ◽  
High Resolution ◽  
Carbon Black ◽  
Single Crystal ◽  
Dark Field ◽  
Graphitized Carbon Black ◽  
Graphitized Carbon ◽  
Dark Field Imaging ◽  
Crystal Films ◽  
Micro Holes

In the previous paper, the author reported on a technique for preparing vapor-deposited single crystal films as high resolution standards for electron microscopy. The present paper is intended to describe the preparation of several high resolution standards for dark field microscopy and also to mention some results obtained from these studies. Three preparations were used initially: 1.) Graphitized carbon black, 2.) Epitaxially grown particles of different metals prepared by vapor deposition, and 3.) Particles grown epitaxially on the edge of micro-holes formed in a gold single crystal film.The authors successfully obtained dark field micrographs demonstrating the 3.4Å lattice spacing of graphitized carbon black and the Au single crystal (111) lattice of 2.35Å. The latter spacing is especially suitable for dark field imaging because of its preparation, as in 3.), above. After the deposited film of Au (001) orientation is prepared at 400°C the substrate temperature is raised, resulting in the formation of many square micro-holes caused by partial evaporation of the Au film.

Structure of Palladium Single-Crystal Films Prepared by Flash Evaporation onto (001) NaCl Substrates

1970 ◽  
Vol 28 ◽  
pp. 456-457
Author(s):  
L. E. Murr ◽  
G. Wong
Keyword(s):  
Single Crystal ◽  
High Vacuum ◽  
Ultra High Vacuum ◽  
High Rate ◽  
Flash Evaporation ◽  
Optimum Load ◽  
Single Crystal Films ◽  
Crystal Films ◽  
A Current

Palladium single-crystal films have been prepared by Matthews in ultra-high vacuum by evaporation onto (001) NaCl substrates cleaved in-situ, and maintained at ∼ 350° C. Murr has also produced large-grained and single-crystal Pd films by high-rate evaporation onto (001) NaCl air-cleaved substrates at 350°C. In the present work, very large (∼ 3cm2), continuous single-crystal films of Pd have been prepared by flash evaporation onto air-cleaved (001) NaCl substrates at temperatures at or below 250°C. Evaporation rates estimated to be ≧ 2000 Å/sec, were obtained by effectively short-circuiting 1 mil tungsten evaporation boats in a self-regulating system which maintained an optimum load current of approximately 90 amperes; corresponding to a current density through the boat of ∼ 4 × 104 amperes/cm2.

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