Solid-Phase Epitaxial Growth of an Alumina Layer Having a Stacking-Mismatched Domain Structure of the Intermediate γ-Phase

2018 ◽  
Vol 10 (48) ◽  
pp. 41487-41496 ◽  
Author(s):  
Jeonghwan Jang ◽  
Seung-Yong Lee ◽  
Hwanyeol Park ◽  
Sangmoon Yoon ◽  
Gyeong-Su Park ◽  
...  
1982 ◽  
Vol 93 (1-2) ◽  
pp. 179-184 ◽  
Author(s):  
J.S. Williams ◽  
F.M. Adams ◽  
K.G. Rossiter

1986 ◽  
Vol 74 ◽  
Author(s):  
Eliezer Dovid Richmond ◽  
Alvin R. Knudson ◽  
H. Kawayoshi

AbstractA new approach is proposed for the material improvement of silicon-on-sapphire (SOS). This approach utilizes the phenomena that the defect elimination throughout the silicon layer depends on both the deep and shallow self-implantations of the double solid phase epitaxial growth (DSPEG) technique for SOS material improvement. The new aspects of this approach are that the deep implantation does not form an amorphous layer, and therefore the ion damage to the substrate is minimized eliminating Al autodoping of the silicon layer.


1984 ◽  
Vol 37 ◽  
Author(s):  
C. S. Pai ◽  
S. S. Lau

AbstractIt has been demonstrated in the literature that amorphous Si (or Ge) can be transported across a metal layer and grown epitaxially on Si(Ge) single crystal substrates in the solid phase. The objective of this study is to investigate if amorphous SixGe1−x mixtures can be transported uniformly across a medium and grown epitaxially on single crystal substrates without phase separation. The samples were prepared by e-beam evaporation of thin Pd films onto Si<100> substrates, followed by co-evaporation of SixGe1−x alloyed films (0<x<1) without breaking vacuum. The samples were anneaie in vacuum at 300°C to form a Pd silicide-germanide layer at the interface, then at 500°C for transport of the alloyed layer across the Pd silicide-germanide layer and subsequent epitaxial growth on Si substrate. The samples were investigated by x-ray diffraction and by MeV ion backscattering and channeling. The results show the alloyed film transports uniformly with no phase separation detected. The channeling result shows the grown alloyed layer is epitaxial with some Pd trapped in the layer. This simple technique is potentially useful for forming lattice-matched non-alloyed ohmic contacts on III–V ternary and quaternary compounds.


1980 ◽  
Vol 37 (2) ◽  
pp. 170-172 ◽  
Author(s):  
S. U. Campisano ◽  
E. Rimini ◽  
P. Baeri ◽  
G. Foti

1984 ◽  
Vol 82 (2) ◽  
pp. 345-353 ◽  
Author(s):  
I. G. Kaverina ◽  
V. V. Korobtsov ◽  
V. G. Zavodinskii ◽  
A. V. Zotov

2013 ◽  
Vol 50 (9) ◽  
pp. 753-759 ◽  
Author(s):  
B. L. Darby ◽  
B. R. Yates ◽  
A. Kumar ◽  
A. Kontos ◽  
R. G. Elliman ◽  
...  

1996 ◽  
Vol 46 (2-3) ◽  
pp. 178-180 ◽  
Author(s):  
Laszlo Csepregi ◽  
Jozsef Gyulai ◽  
S.S. Lau

1985 ◽  
Vol 46 (3) ◽  
pp. 268-270 ◽  
Author(s):  
Hiroshi Yamamoto ◽  
Hiroshi Ishiwara ◽  
Seijiro Furukawa

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