Superior Dielectric Screening in Two-Dimensional MoS2 Spirals

2017 ◽  
Vol 9 (43) ◽  
pp. 37941-37946 ◽  
Author(s):  
Thuc Hue Ly ◽  
Hyun Kim ◽  
Quoc Huy Thi ◽  
Shu Ping Lau ◽  
Jiong Zhao
Keyword(s):  
Two Dimensional ◽  
Dielectric Screening

scholarly journals The Schottky–Mott Rule Expanded for Two-Dimensional Semiconductors: Influence of Substrate Dielectric Screening

ACS Nano ◽  
2021 ◽  
Author(s):  
Soohyung Park ◽  
Thorsten Schultz ◽  
Dongguen Shin ◽  
Niklas Mutz ◽  
Areej Aljarb ◽  
...  
Keyword(s):  
Two Dimensional ◽  
Dielectric Screening ◽  
Influence Of Substrate

scholarly journals Rigid Band Shifts in Two-Dimensional Semiconductors through External Dielectric Screening

2019 ◽  
Vol 123 (20) ◽  
Author(s):  
Lutz Waldecker ◽  
Archana Raja ◽  
Malte Rösner ◽  
Christina Steinke ◽  
Aaron Bostwick ◽  
...  
Keyword(s):  
Two Dimensional ◽  
Dielectric Screening

Twist in the Tale: Exploring the Dielectric Screening Effect in Twisted Bilayer Graphene

2022 ◽  
Vol 2 ◽  
Keyword(s):  
Electric Field ◽  
External Electric Field ◽  
Electronic States ◽  
Bilayer Graphene ◽  
Two Dimensional ◽  
Screening Effect ◽  
Dielectric Screening ◽  
Twisted Bilayer Graphene

Although the screening of an external electric field, strongly influences the electronic states of two-dimensional material stack, it is not well understood. Magnetotransport measurements of twisted double bilayer graphene uncovered the screening of atomic layers.

Vertical dielectric screening of few-layer van der Waals semiconductors

Nanoscale ◽  
2017 ◽  
Vol 9 (38) ◽  
pp. 14540-14547 ◽  
Author(s):  
Jahyun Koo ◽  
Shiyuan Gao ◽  
Hoonkyung Lee ◽  
Li Yang
Keyword(s):  
Van Der Waals ◽  
Fundamental Parameter ◽  
Two Dimensional ◽  
2D Semiconductors ◽  
Dielectric Screening

Vertical dielectric screening is a fundamental parameter of few-layer van der Waals two-dimensional (2D) semiconductors.

Controlling exciton transport in monolayer MoSe2 by dielectric screening

2020 ◽  
Vol 5 (1) ◽  
pp. 139-143 ◽  
Author(s):  
Shengcai Hao ◽  
Matthew Z. Bellus ◽  
Dawei He ◽  
Yongsheng Wang ◽  
Hui Zhao
Keyword(s):  
Dielectric Layer ◽  
Two Dimensional ◽  
Exciton Transport ◽  
Dielectric Screening

Exciton transport in a two-dimensional semiconductor is controlled by placing a top dielectric layer.

Spectrophotometric measurements of objective-prism spectra

1966 ◽  
Vol 24 ◽  
pp. 118-119
Author(s):  
Th. Schmidt-Kaler
Keyword(s):  
Progress Report ◽  
Two Dimensional ◽  
Objective Prism ◽  
Made In

I should like to give you a very condensed progress report on some spectrophotometric measurements of objective-prism spectra made in collaboration with H. Leicher at Bonn. The procedure used is almost completely automatic. The measurements are made with the help of a semi-automatic fully digitized registering microphotometer constructed by Hög-Hamburg. The reductions are carried out with the aid of a number of interconnected programmes written for the computer IBM 7090, beginning with the output of the photometer in the form of punched cards and ending with the printing-out of the final two-dimensional classifications.

Sign in / Sign up

Export Citation Format

Share Document