Grazing Incidence Cross-Sectioning of Thin-Film Solar Cells via Cryogenic Focused Ion Beam: A Case Study on CIGSe

2016 ◽  
Vol 8 (24) ◽  
pp. 14994-14999 ◽  
Author(s):  
Kasra Sardashti ◽  
Richard Haight ◽  
Ryan Anderson ◽  
Miguel Contreras ◽  
Bernd Fruhberger ◽  
...  
Keyword(s):  
Thin Film ◽  
Solar Cells ◽  
Focused Ion Beam ◽  
Ion Beam ◽  
Grazing Incidence ◽  
Thin Film Solar Cells

Generation of electrical defects in ion beam assisted deposition of Cu(In,Ga)Se2 thin film solar cells

2011 ◽  
Vol 519 (21) ◽  
pp. 7317-7320 ◽  
Author(s):  
H. Zachmann ◽  
S. Puttnins ◽  
F. Daume ◽  
A. Rahm ◽  
K. Otte
Keyword(s):  
Thin Film ◽  
Solar Cells ◽  
Ion Beam ◽  
Thin Film Solar Cells ◽  
Ion Beam Assisted Deposition

scholarly journals Cation disorder in CZTS materials from anomalous diffraction at KMC-2 (BESSY)

2014 ◽  
Vol 70 (a1) ◽  
pp. C1774-C1774
Author(s):  
Daniel Többens ◽  
Kai Neldner ◽  
Laura Valle-Rios ◽  
Susan Schorr
Keyword(s):  
Thin Film ◽  
Solar Cells ◽  
Grazing Incidence ◽  
Thin Film Solar Cells ◽  
Anomalous Scattering ◽  
X Ray Diffraction ◽  
Promising Alternative ◽  
X Ray ◽  
Cu And Zn ◽  
Absorption Edges

The compound semiconductor Cu2ZnSnS4 (CZTS) is a promising alternative for absorber layers in thin film solar cells, as it has a nearly ideal band gap of about 1.5 eV, a high absorption coefficient for visible light, and contains only earth abundant and non-toxic elements. Besides chemical composition and phase purity, the efficiency of CZTS thin film solar cells depends strongly on the concentration of Cu- and Zn-antisites and copper vacancies in the kesterite-type structure. However, Cu(I) and Zn(II) are isoelectric and thus cannot be distinguished by conventional X-ray diffraction. In prior work we determined Cu-Zn-distribution successfully from neutron scattering [1]. Here we present experiments utilizing anomalous X-ray diffraction on the K-edges of Cu and Zn. Anomalous scattering coefficients are heavily wavelength-dependent close to the absorption edges of the respective element. This is utilized for contrast enhancement. Usage of multiple wavelengths above, below and between the absorption edges of Cu and Zn ensures significant overdetermination, so that the Cu-, Zn-, and vacancy concentrations can be refined reliably for the independent crystallographic sites. Experiments were conducted at the diffraction end station of the KMC-2 beamline [2] at BESSY (Berlin, Germany). KMC-2 provides X-ray radiation with both very stable energies and intensities. The accessible energy range of 4 – 14 keV is ideally suited for the K-edges of Cu (8979 eV) and Zn (9659 eV). A 6-circle goniometer in psi-geometry allows both powder and grazing incidence diffraction, so that bulk samples and thin films can be measured. The instrument can be equipped with either a scintillation point detector (Cyberstar) or an area detector (Bruker Vantec), allowing to optimize resolution and intensity to the needs of the experiment.

scholarly journals Extensive Analysis of Structure-Property Relationships in Thin-Film Solar Cells Using Scanning Electron Microscopy in Combination with Focused Ion Beam

2013 ◽  
Vol 19 (S2) ◽  
pp. 1096-1097
Author(s):  
D. Abou-Ras ◽  
K. Tsyrulin ◽  
N. Schäfer ◽  
M. Nichterwitz ◽  
H. Kropf ◽  
...  
Keyword(s):  
Thin Film ◽  
Electron Microscopy ◽  
Scanning Electron Microscopy ◽  
Focused Ion Beam ◽  
Ion Beam ◽  
Thin Film Solar Cells ◽  
Structure Property ◽  
Structure Property Relationships ◽  
Extensive Analysis ◽  
Scanning Electron

Extended abstract of a paper presented at Microscopy and Microanalysis 2013 in Indianapolis, Indiana, USA, August 4 – August 8, 2013.

Diverse simulations of time-resolved photoluminescence in thin-film solar cells: A SnO2/CdSeyTe1−y case study

2021 ◽  
Vol 130 (16) ◽  
pp. 163105
Author(s):  
John Moseley ◽  
Dmitry Krasikov ◽  
Chungho Lee ◽  
Darius Kuciauskas
Keyword(s):  
Thin Film ◽  
Solar Cells ◽  
Thin Film Solar Cells ◽  
Time Resolved ◽  
Time Resolved Photoluminescence

Grazing incidence X-ray fluorescence analysis of buried interfaces in periodically structured crystalline silicon thin-film solar cells

2015 ◽  
Vol 212 (3) ◽  
pp. 529-534 ◽  
Author(s):  
David Eisenhauer ◽  
Beatrix Pollakowski ◽  
Jonas Baumann ◽  
Veit Preidel ◽  
Daniel Amkreutz ◽  
...  
Keyword(s):  
Thin Film ◽  
Solar Cells ◽  
Crystalline Silicon ◽  
Fluorescence Analysis ◽  
Grazing Incidence ◽  
Thin Film Solar Cells ◽  
Silicon Thin Film ◽  
X Ray ◽  
Buried Interfaces

Ion beam analysis of Cu(In,Ga)Se 2 thin film solar cells

2015 ◽  
Vol 356 ◽  
pp. 631-638 ◽  
Author(s):  
A.G. Karydas ◽  
C. Streeck ◽  
I. Bogdanovic Radovic ◽  
C. Kaufmann ◽  
T. Rissom ◽  
...  
Keyword(s):  
Thin Film ◽  
Solar Cells ◽  
Ion Beam ◽  
Thin Film Solar Cells ◽  
Ion Beam Analysis ◽  
Beam Analysis
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