Grazing incidence X-ray fluorescence analysis of buried interfaces in periodically structured crystalline silicon thin-film solar cells

2015 ◽  
Vol 212 (3) ◽  
pp. 529-534 ◽  
Author(s):  
David Eisenhauer ◽  
Beatrix Pollakowski ◽  
Jonas Baumann ◽  
Veit Preidel ◽  
Daniel Amkreutz ◽  
...  
Keyword(s):  
Thin Film ◽  
Solar Cells ◽  
Crystalline Silicon ◽  
Fluorescence Analysis ◽  
Grazing Incidence ◽  
Thin Film Solar Cells ◽  
Silicon Thin Film ◽  
X Ray ◽  
Buried Interfaces

scholarly journals Biomimetic spiral grating for stable and highly efficient absorption in crystalline silicon thin-film solar cells: erratum

2017 ◽  
Vol 25 (24) ◽  
pp. A1053
Author(s):  
Jin Hou ◽  
Wei Hong ◽  
Xiaohang Li ◽  
Chunyong Yang ◽  
Shaoping Chen
Keyword(s):  
Thin Film ◽  
Solar Cells ◽  
Crystalline Silicon ◽  
Thin Film Solar Cells ◽  
Silicon Thin Film ◽  
Highly Efficient

Chemical speciation at buried interfaces in high-temperature processed polycrystalline silicon thin-film solar cells on ZnO:Al

2013 ◽  
Vol 113 (4) ◽  
pp. 044519 ◽  
Author(s):  
Christiane Becker ◽  
Marcel Pagels ◽  
Carolin Zachäus ◽  
Beatrix Pollakowski ◽  
Burkhard Beckhoff ◽  
...  
Keyword(s):  
Thin Film ◽  
Solar Cells ◽  
High Temperature ◽  
Polycrystalline Silicon ◽  
Chemical Speciation ◽  
Thin Film Solar Cells ◽  
Silicon Thin Film ◽  
Buried Interfaces

Towards wafer quality crystalline silicon thin-film solar cells on glass

2014 ◽  
Vol 128 ◽  
pp. 190-197 ◽  
Author(s):  
Jan Haschke ◽  
Daniel Amkreutz ◽  
Lars Korte ◽  
Florian Ruske ◽  
Bernd Rech
Keyword(s):  
Thin Film ◽  
Solar Cells ◽  
Crystalline Silicon ◽  
Thin Film Solar Cells ◽  
Silicon Thin Film

scholarly journals Cation disorder in CZTS materials from anomalous diffraction at KMC-2 (BESSY)

2014 ◽  
Vol 70 (a1) ◽  
pp. C1774-C1774
Author(s):  
Daniel Többens ◽  
Kai Neldner ◽  
Laura Valle-Rios ◽  
Susan Schorr
Keyword(s):  
Thin Film ◽  
Solar Cells ◽  
Grazing Incidence ◽  
Thin Film Solar Cells ◽  
Anomalous Scattering ◽  
X Ray Diffraction ◽  
Promising Alternative ◽  
X Ray ◽  
Cu And Zn ◽  
Absorption Edges

The compound semiconductor Cu2ZnSnS4 (CZTS) is a promising alternative for absorber layers in thin film solar cells, as it has a nearly ideal band gap of about 1.5 eV, a high absorption coefficient for visible light, and contains only earth abundant and non-toxic elements. Besides chemical composition and phase purity, the efficiency of CZTS thin film solar cells depends strongly on the concentration of Cu- and Zn-antisites and copper vacancies in the kesterite-type structure. However, Cu(I) and Zn(II) are isoelectric and thus cannot be distinguished by conventional X-ray diffraction. In prior work we determined Cu-Zn-distribution successfully from neutron scattering [1]. Here we present experiments utilizing anomalous X-ray diffraction on the K-edges of Cu and Zn. Anomalous scattering coefficients are heavily wavelength-dependent close to the absorption edges of the respective element. This is utilized for contrast enhancement. Usage of multiple wavelengths above, below and between the absorption edges of Cu and Zn ensures significant overdetermination, so that the Cu-, Zn-, and vacancy concentrations can be refined reliably for the independent crystallographic sites. Experiments were conducted at the diffraction end station of the KMC-2 beamline [2] at BESSY (Berlin, Germany). KMC-2 provides X-ray radiation with both very stable energies and intensities. The accessible energy range of 4 – 14 keV is ideally suited for the K-edges of Cu (8979 eV) and Zn (9659 eV). A 6-circle goniometer in psi-geometry allows both powder and grazing incidence diffraction, so that bulk samples and thin films can be measured. The instrument can be equipped with either a scintillation point detector (Cyberstar) or an area detector (Bruker Vantec), allowing to optimize resolution and intensity to the needs of the experiment.

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