Extreme Ultraviolet Generation of Localized Defects in Single-Layer Graphene: Raman Mapping, Atomic Force Microscopy, and High-Resolution Scanning Electron Microscopy Analysis
2019 ◽
Vol 1
(12)
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pp. 2560-2565
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2015 ◽
Vol 1
(2)
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pp. 52-58
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2014 ◽
Vol 97
(5)
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pp. 411-417
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Keyword(s):
Keyword(s):
2020 ◽
Vol 11
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pp. 814-820
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