Domain structures of single layer graphene imaged with conductive probe atomic force microscopy

2012 ◽  
Vol 44 (6) ◽  
pp. 768-771 ◽  
Author(s):  
Sangku Kwon ◽  
H. J. Chung ◽  
Sunae Seo ◽  
Jeong Young Park
Keyword(s):  
Atomic Force Microscopy ◽  
Single Layer ◽  
Single Layer Graphene ◽  
Force Microscopy ◽  
Layer Graphene ◽  
Domain Structures ◽  
Atomic Force

scholarly journals Configurational Effects on Strain and Doping at Graphene-Silver Nanowire Interfaces

2020 ◽  
Vol 10 (15) ◽  
pp. 5157
Author(s):  
Frank Lee ◽  
Manoj Tripathi ◽  
Peter Lynch ◽  
Alan B. Dalton
Keyword(s):  
Atomic Force Microscopy ◽  
Adhesion Force ◽  
Single Layer ◽  
Silver Nanowire ◽  
Single Layer Graphene ◽  
Fermi Energy Level ◽  
Essential Information ◽  
Force Microscopy ◽  
Layer Graphene ◽  
Atomic Force

Graphene shows substrate-dependent physical and electronic properties. Here, we presented the interaction between single-layer graphene and silver nanowire (AgNW) in terms of physical straining and doping. We observed a snap-through event for single-layer graphene/AgNW at a separation of AgNWs of 55 nm, beyond the graphene suspended over the nanowires. The adhesion force between the Atomic Force Microscopy (AFM) tip apex and the suspended graphene was measured as higher than the conformed one by 1.8 nN. The presence of AgNW modulates the Fermi energy level of graphene and reduces the work function by 0.25 eV, which results in n-type doping. Consequently, a lateral p-n-p junction is formed with single AgNW. The correlation Raman plot between G-2D modes reveals the increment of strain in graphene of 0.05% due to the curvature around AgNW, and 0.01% when AgNW lies on the top of graphene. These results provide essential information in inspecting the physical and electronic influences from AgNW.

Nanolithography of Single-Layer Graphene Oxide Films by Atomic Force Microscopy

Langmuir ◽  
2010 ◽  
Vol 26 (9) ◽  
pp. 6164-6166 ◽  
Author(s):  
Gang Lu ◽  
Xiaozhu Zhou ◽  
Hai Li ◽  
Zongyou Yin ◽  
Bing Li ◽  
...  
Keyword(s):  
Atomic Force Microscopy ◽  
Graphene Oxide ◽  
Oxide Films ◽  
Single Layer ◽  
Single Layer Graphene ◽  
Force Microscopy ◽  
Layer Graphene ◽  
Atomic Force

Structural Strain in Single Layer Graphene Fabricated on SiC

2019 ◽  
Vol 963 ◽  
pp. 161-165
Author(s):  
Wan Cheng Yu ◽  
Xiu Fang Chen ◽  
Xiao Bo Hu ◽  
Xian Gang Xu ◽  
Peng Jin ◽  
...  
Keyword(s):  
Thermal Decomposition ◽  
Single Layer ◽  
Ex Situ ◽  
Single Layer Graphene ◽  
Growth Time ◽  
Kelvin Probe ◽  
Force Microscopy ◽  
Layer Graphene ◽  
Atomic Force ◽  
Structural Strain

Single layer graphene is fabricated on the Si face of silicon carbide through thermal decomposition. The thickness of graphene was checked by a combination of ex situ Kelvin probe force microscopy together with Raman spectroscopy and atomic force microscopy. The amount of residual strain induced is calculated to between 1.3% and 0.7%. Results also show that the magnitude of strain increased with growth time while the uniformity of strain improved.

Strain-Engineered Rippling and Manipulation of Single-Layer WS2 by Atomic Force Microscopy

2021 ◽  
Vol 125 (16) ◽  
pp. 8696-8703
Author(s):  
Fei Pang ◽  
Feiyue Cao ◽  
Le Lei ◽  
Lan Meng ◽  
Shili Ye ◽  
...  
Keyword(s):  
Atomic Force Microscopy ◽  
Single Layer ◽  
Force Microscopy ◽  
Atomic Force

scholarly journals Templating effect of single-layer graphene supported by an insulating substrate on the molecular orientation of lead phthalocyanine

2020 ◽  
Vol 11 ◽  
pp. 814-820 ◽  
Author(s):  
K Priya Madhuri ◽  
Abhay A Sagade ◽  
Pralay K Santra ◽  
Neena S John
Keyword(s):  
Electrical Characterization ◽  
Single Layer ◽  
Grazing Incidence ◽  
Single Layer Graphene ◽  
Force Microscopy ◽  
Layer Graphene ◽  
Standing Up ◽  
Specific Device ◽  
Device Applications ◽  
Molecule Interactions

The influence of single-layer graphene on top of a SiO2/Si surface on the orientation of nonplanar lead phthalocyanine (PbPc) molecules is studied using two-dimensional grazing incidence X-ray diffraction. The studies indicate the formation of a mixture of polymorphs, i.e., monoclinic and triclinic forms of PbPc with face-on (lying down) and edge-on (standing up) PbPc orientations, respectively. The formation of monoclinic fractions is attributed to the presence of the graphene layer directing the π interactions between the highly delocalized macrocycles. The competing interfacial van der Waals forces and molecule–molecule interactions lead to the formation of a small fraction of triclinic moieties. The nanoscale electrical characterization of the thin PbPc layer on graphene by means of conducting atomic force microscopy shows enhanced vertical conductance with interconnected conducting domains consisting of ordered monoclinic crystallites through which the charge transfer occurs via tunneling. These results show the importance of a templating layer to induce the formation of a required phase of PbPc suitable for specific device applications.

scholarly journals Graphene on SiC(0001) inspected by dynamic atomic force microscopy at room temperature

2015 ◽  
Vol 6 ◽  
pp. 901-906 ◽  
Author(s):  
Mykola Telychko ◽  
Jan Berger ◽  
Zsolt Majzik ◽  
Pavel Jelínek ◽  
Martin Švec
Keyword(s):  
Electron Scattering ◽  
Room Temperature ◽  
Single Layer ◽  
Tunneling Current ◽  
Single Layer Graphene ◽  
Force Microscopy ◽  
Atomic Force ◽  
Scattering Effects ◽  
Out Of Plane ◽  
Theoretical Simulations

We investigated single-layer graphene on SiC(0001) by atomic force and tunneling current microscopy, to separate the topographic and electronic contributions from the overall landscape. The analysis revealed that the roughness evaluated from the atomic force maps is very low, in accord with theoretical simulations. We also observed that characteristic electron scattering effects on graphene edges and defects are not accompanied by any out-of-plane relaxations of carbon atoms.

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