Strain-Engineered Rippling and Manipulation of Single-Layer WS2 by Atomic Force Microscopy

2021 ◽  
Vol 125 (16) ◽  
pp. 8696-8703
Author(s):  
Fei Pang ◽  
Feiyue Cao ◽  
Le Lei ◽  
Lan Meng ◽  
Shili Ye ◽  
...  
Keyword(s):  
Atomic Force Microscopy ◽  
Single Layer ◽  
Force Microscopy ◽  
Atomic Force

Single layer growth of sub-micron metal–organic framework crystals observed by in situ atomic force microscopy

2009 ◽  
pp. 6294 ◽  
Author(s):  
Neena S. John ◽  
Camilla Scherb ◽  
Maryiam Shöâeè ◽  
Michael W. Anderson ◽  
Martin P. Attfield ◽  
...  
Keyword(s):  
Atomic Force Microscopy ◽  
Metal Organic Framework ◽  
Single Layer ◽  
Layer Growth ◽  
Force Microscopy ◽  
Atomic Force ◽  
Metal Organic ◽  
Organic Framework

scholarly journals Tribological Characteristics of Single-Layer h-BN Measured by Colloidal Probe Atomic Force Microscopy

Coatings ◽  
2020 ◽  
Vol 10 (6) ◽  
pp. 530
Author(s):  
Tien Van Tran ◽  
Koo-Hyun Chung
Keyword(s):  
Atomic Force Microscopy ◽  
Solid Lubricant ◽  
Normal Force ◽  
Coating Layer ◽  
Single Layer ◽  
Tribological Characteristics ◽  
Si Substrate ◽  
Colloidal Probe ◽  
Force Microscopy ◽  
Atomic Force

The tribological characteristics of single-layer (1L) hexagonal-boron nitride (h-BN) were systematically investigated using colloidal probe atomic force microscopy, with an aim to elucidate the feasibility as a protective coating layer and solid lubricant for micro- and nanodevices. The experiments were performed to detect the occurrence of failure of 1L h-BN for up to 10,000 cycles under various normal forces. The failure of 1L h-BN did not occur for 10,000 cycles under a 10 μN normal force, corresponding to a contact pressure of about 0.34 GPa. However, the complete failure of 1L h-BN occurred faster with an increasing normal force from 20 to 42 μN. It was observed that the SiO2/Si substrate was locally exposed due to defect formation on the 1L h-BN. The Raman spectroscopy measurement results further suggest that the failure was associated with the compressive strain on 1L h-BN. The friction of 1L h-BN before failure was orders of magnitude smaller than that of a SiO2/Si substrate. The overall results indicate the feasibility of atomically thin h-BN as a protective coating layer and solid lubricant. In particular, the results of this work provide fundamental tribological characteristics of pristine h-BN as a guide, which may be helpful in other practical deposition methods for atomically thin h-BN with enhanced tribological characteristics.

Nanoscratch on single-layer MoS2 crystal by atomic force microscopy: semi-circular to periodical zigzag cracks

2018 ◽  
Vol 6 (2) ◽  
pp. 025048 ◽  
Author(s):  
Shili Ye ◽  
Kunqi Xu ◽  
Le Lei ◽  
Sabir Hussain ◽  
Fei Pang ◽  
...  
Keyword(s):  
Atomic Force Microscopy ◽  
Single Layer ◽  
Force Microscopy ◽  
Atomic Force

scholarly journals Configurational Effects on Strain and Doping at Graphene-Silver Nanowire Interfaces

2020 ◽  
Vol 10 (15) ◽  
pp. 5157
Author(s):  
Frank Lee ◽  
Manoj Tripathi ◽  
Peter Lynch ◽  
Alan B. Dalton
Keyword(s):  
Atomic Force Microscopy ◽  
Adhesion Force ◽  
Single Layer ◽  
Silver Nanowire ◽  
Single Layer Graphene ◽  
Fermi Energy Level ◽  
Essential Information ◽  
Force Microscopy ◽  
Layer Graphene ◽  
Atomic Force

Graphene shows substrate-dependent physical and electronic properties. Here, we presented the interaction between single-layer graphene and silver nanowire (AgNW) in terms of physical straining and doping. We observed a snap-through event for single-layer graphene/AgNW at a separation of AgNWs of 55 nm, beyond the graphene suspended over the nanowires. The adhesion force between the Atomic Force Microscopy (AFM) tip apex and the suspended graphene was measured as higher than the conformed one by 1.8 nN. The presence of AgNW modulates the Fermi energy level of graphene and reduces the work function by 0.25 eV, which results in n-type doping. Consequently, a lateral p-n-p junction is formed with single AgNW. The correlation Raman plot between G-2D modes reveals the increment of strain in graphene of 0.05% due to the curvature around AgNW, and 0.01% when AgNW lies on the top of graphene. These results provide essential information in inspecting the physical and electronic influences from AgNW.

An Atomic Force Microscopy Study of Single-Layer FeSe Superconductor

2013 ◽  
Vol 6 (11) ◽  
pp. 113101 ◽  
Author(s):  
Na Li ◽  
Zhi Li ◽  
Hao Ding ◽  
Shuaihua Ji ◽  
Xi Chen ◽  
...  
Keyword(s):  
Atomic Force Microscopy ◽  
Single Layer ◽  
Microscopy Study ◽  
Atomic Force Microscopy Study ◽  
Force Microscopy ◽  
Atomic Force

Nanolithography of Single-Layer Graphene Oxide Films by Atomic Force Microscopy

Langmuir ◽  
2010 ◽  
Vol 26 (9) ◽  
pp. 6164-6166 ◽  
Author(s):  
Gang Lu ◽  
Xiaozhu Zhou ◽  
Hai Li ◽  
Zongyou Yin ◽  
Bing Li ◽  
...  
Keyword(s):  
Atomic Force Microscopy ◽  
Graphene Oxide ◽  
Oxide Films ◽  
Single Layer ◽  
Single Layer Graphene ◽  
Force Microscopy ◽  
Layer Graphene ◽  
Atomic Force

Adhesive Energy of Zinc Oxide and Graphite, Molecular Dynamics and Atomic Force Microscopy Study

2012 ◽  
Vol 1479 ◽  
pp. 89-94
Author(s):  
Ulises Galan ◽  
Henry A. Sodano
Keyword(s):  
Molecular Dynamics ◽  
Atomic Force Microscopy ◽  
Zinc Oxide ◽  
Single Layer ◽  
Md Simulations ◽  
Microscopy Study ◽  
Graphitic Carbon ◽  
Force Microscopy ◽  
Atomic Force ◽  
Lift Off

AbstractMolecular Dynamics (MD) simulations are performed to calculate the interfacial energy between zinc oxide (ZnO) and graphitic carbon for the study of solid–solid adhesion. The MD model consists of a ZnO slab and a single layer of graphitic carbon. The calculation was validated experimentally by atomic force microscopy (AFM) liftoff. A polishing process was applied to create a tip with a flat surface that was subsequently coated with a ZnO film allowing force displacement measurement on Highly Oriented Pyrolitic Graphite to validate the simulations. The MD simulation and AFM lift-off show good agreement with adhesive energies of 0.303 J/m2 and 0.261 ± 0.054 J/m2, respectively.

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