Adhesive Energy of Zinc Oxide and Graphite, Molecular Dynamics and Atomic Force Microscopy Study

2012 ◽  
Vol 1479 ◽  
pp. 89-94
Author(s):  
Ulises Galan ◽  
Henry A. Sodano
Keyword(s):  
Molecular Dynamics ◽  
Atomic Force Microscopy ◽  
Zinc Oxide ◽  
Single Layer ◽  
Md Simulations ◽  
Microscopy Study ◽  
Graphitic Carbon ◽  
Force Microscopy ◽  
Atomic Force ◽  
Lift Off

AbstractMolecular Dynamics (MD) simulations are performed to calculate the interfacial energy between zinc oxide (ZnO) and graphitic carbon for the study of solid–solid adhesion. The MD model consists of a ZnO slab and a single layer of graphitic carbon. The calculation was validated experimentally by atomic force microscopy (AFM) liftoff. A polishing process was applied to create a tip with a flat surface that was subsequently coated with a ZnO film allowing force displacement measurement on Highly Oriented Pyrolitic Graphite to validate the simulations. The MD simulation and AFM lift-off show good agreement with adhesive energies of 0.303 J/m2 and 0.261 ± 0.054 J/m2, respectively.

Atomic force microscopy study of small-size nanotubular polymer thin films

1999 ◽  
Vol 14 (3) ◽  
pp. 1084-1090 ◽  
Author(s):  
C. F. Zhu ◽  
I. Lee ◽  
J. W. Li ◽  
C. Wang ◽  
X. Y. Cao ◽  
...  
Keyword(s):  
Thin Films ◽  
Molecular Dynamics ◽  
Atomic Force Microscopy ◽  
Room Temperature ◽  
Polymer Thin Films ◽  
Microscopy Study ◽  
Atomic Force Microscopy Study ◽  
Contact Mode ◽  
Force Microscopy ◽  
Atomic Force

In this paper, we report atomic force microscopy (AFM) images of a tubular polymer and its supermolecular polymer thin films, operated in contact mode at room temperature in air. The configuration models are also calculated using molecular dynamics. The diameter of the polymer nanotube is about 0.7 nm, the smallest size a tube can have. The results of calculation agree with the experimental results.

An Atomic Force Microscopy Study of Single-Layer FeSe Superconductor

2013 ◽  
Vol 6 (11) ◽  
pp. 113101 ◽  
Author(s):  
Na Li ◽  
Zhi Li ◽  
Hao Ding ◽  
Shuaihua Ji ◽  
Xi Chen ◽  
...  
Keyword(s):  
Atomic Force Microscopy ◽  
Single Layer ◽  
Microscopy Study ◽  
Atomic Force Microscopy Study ◽  
Force Microscopy ◽  
Atomic Force

Nanoindentation Models With Realistic AFM Tip Geometries

2015 ◽  
Author(s):  
Rapeepan Promyoo ◽  
Hazim El-Mounayri ◽  
Kody Varahramyan
Keyword(s):  
Molecular Dynamics ◽  
Atomic Force Microscopy ◽  
Md Simulation ◽  
Three Dimensional ◽  
Md Simulations ◽  
Gold Substrate ◽  
Force Microscopy ◽  
Atomic Force ◽  
Defect Mechanism ◽  
Tip Radius

In this paper, a three-dimensional computational model for Atomic Force Microscopy (AFM) based nanoindentation processes is being developed. Molecular Dynamics (MD) and Finite Element (FE) techniques are used to model and simulate mechanical indentation at the nanoscale. The correlation between the indentation conditions, including applied force and tip radius, and defect mechanism in substrate is investigated. The tip geometries used in the model are the same as those used in the experiments. The MD simulations of nanoindentation process are performed on different crystal orientations of single-crystal gold substrate, Au(100), Au(110), and Au(111). In MD simulation, the material deformation is extracted from the final locations of atoms, which are displaced by the rigid indenter. The simulation also allows for the prediction of forces at the interface between the indenter and substrate. In addition to the modeling, an AFM is used to conduct actual indentation at the nanoscale, and provide measurements to which the simulation predictions are compared.

Adsorption of Polyethylenimine on Graphite:  An Atomic Force Microscopy Study

2003 ◽  
Vol 36 (25) ◽  
pp. 9510-9518 ◽  
Author(s):  
Marc Schneider ◽  
Martin Brinkmann ◽  
Helmuth Möhwald
Keyword(s):  
Atomic Force Microscopy ◽  
Microscopy Study ◽  
Atomic Force Microscopy Study ◽  
Force Microscopy ◽  
Atomic Force

Strain-Engineered Rippling and Manipulation of Single-Layer WS2 by Atomic Force Microscopy

2021 ◽  
Vol 125 (16) ◽  
pp. 8696-8703
Author(s):  
Fei Pang ◽  
Feiyue Cao ◽  
Le Lei ◽  
Lan Meng ◽  
Shili Ye ◽  
...  
Keyword(s):  
Atomic Force Microscopy ◽  
Single Layer ◽  
Force Microscopy ◽  
Atomic Force
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