Synthesis of silicon quantum dots in zinc silicate matrix by low-temperature process: Optical, structural and electrical characterization

2014 ◽  
Vol 562 ◽  
pp. 172-180 ◽  
Author(s):  
Anna Castaldo ◽  
Alessandro Antonaia ◽  
Maria Luisa Addonizio
2020 ◽  
Vol 222 ◽  
pp. 190-200
Author(s):  
Timothy T. Koh ◽  
Tingting Huang ◽  
Joseph Schwan ◽  
Pan Xia ◽  
Sean T. Roberts ◽  
...  

Non-thermal plasma synthesized silicon QDs are functionalized with aromatic and aliphatic ligands using a 2,2′-azobis(2-methylpropionitrile) AIBN radical initiator with hydrosilylation at 60 °C for photon upconversion.


2012 ◽  
Vol 116 (6) ◽  
pp. 3979-3987 ◽  
Author(s):  
I. E. Anderson ◽  
R. A. Shircliff ◽  
C. Macauley ◽  
D. K. Smith ◽  
B. G. Lee ◽  
...  

2016 ◽  
Vol 18 (23) ◽  
pp. 15697-15710 ◽  
Author(s):  
Bibhuti Bhusan Sahu ◽  
Yongyi Yin ◽  
Jeon Geon Han ◽  
Masaharu Shiratani

The design of advanced plasma processes by plasma and radical control is essential for the controlled low-temperature deposition of different size QDs.


APL Materials ◽  
2020 ◽  
Vol 8 (8) ◽  
pp. 081105
Author(s):  
Toshihiro Nakamura ◽  
Nobuyoshi Koshida ◽  
Ze Yuan ◽  
Jun Otsubo

NANO ◽  
2009 ◽  
Vol 04 (05) ◽  
pp. 265-279 ◽  
Author(s):  
A. K. PANCHAL ◽  
D. K. RAI ◽  
M. MATHEW ◽  
C. S. SOLANKI

This paper reviews research works carried out on silicon quantum dots ( Si -QDs) embedded in the silicon nitride ( SiN x) dielectric matrix films with different fabrication techniques and different characteristics. The advantages of SiN x as a dielectric compared to silicon dioxide ( SiO 2) for Si -QDs from a device point of view are discussed. Various fabrication techniques along with different optimized deposition conditions are summarized. The typical results of structural characteristics of the films with Raman spectroscopy and Transmission Electron Microscopy (TEM) are discussed. The origin of photoluminescence (PL) from the films and the chemical compositional analysis such as X-Ray Diffraction (XRD), Fourier Transform Infrared Spectroscopy (FTIR) and Secondary Ion Mass Spectroscopy (SIMS) analysis of the films are also made available in brief. The charge conduction mechanism in the films with metal–insulator–semiconductor (MIS) structure, with their electrical characterization like capacitance–voltage (C–V) and current–voltage (I–V) measurements are presented.


2018 ◽  
Author(s):  
Oscar A. Douglas-Gallardo ◽  
Cristián Gabriel Sánchez ◽  
Esteban Vöhringer-Martinez

<div> <div> <div> <p>Nowadays, the search of efficient methods able to reduce the high atmospheric carbon dioxide concentration has turned into a very dynamic research area. Several environmental problems have been closely associated with the high atmospheric level of this greenhouse gas. Here, a novel system based on the use of surface-functionalized silicon quantum dots (sf -SiQDs) is theoretically proposed as a versatile device to bind carbon dioxide. Within this approach, carbon dioxide trapping is modulated by a photoinduced charge redistribution between the capping molecule and the silicon quantum dots (SiQDs). Chemical and electronic properties of the proposed SiQDs have been studied with Density Functional Theory (DFT) and Density Functional Tight-Binding (DFTB) approach along with a Time-Dependent model based on the DFTB (TD-DFTB) framework. To the best of our knowledge, this is the first report that proposes and explores the potential application of a versatile and friendly device based on the use of sf -SiQDs for photochemically activated carbon dioxide fixation. </p> </div> </div> </div>


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