Atmospheric neutron single event effect test on Xilinx 28 nm system on chip at CSNS-BL09

2019 ◽  
Vol 99 ◽  
pp. 119-124 ◽  
Author(s):  
Weitao Yang ◽  
Yonghong Li ◽  
Yang Li ◽  
Zhiliang Hu ◽  
Fei Xie ◽  
...  
Keyword(s):  
System On Chip ◽  
Single Event ◽  
Single Event Effect ◽  
On Chip ◽  
Effect Test

Investigation of single event effect in 28-nm system-on-chip with multi patterns

2020 ◽  
Vol 29 (10) ◽  
pp. 108504
Author(s):  
Wei-Tao Yang ◽  
Yong-Hong Li ◽  
Ya-Xin Guo ◽  
Hao-Yu Zhao ◽  
Yang Li ◽  
...  
Keyword(s):  
System On Chip ◽  
Single Event ◽  
Single Event Effect ◽  
On Chip ◽  
28 Nm

Microbeam Heavy-Ion Single-Event Effect on Xilinx 28-nm System on Chip

2018 ◽  
Vol 65 (1) ◽  
pp. 545-549 ◽  
Author(s):  
Weitao Yang ◽  
Xuecheng Du ◽  
Chaohui He ◽  
Shuting Shi ◽  
Li Cai ◽  
...  
Keyword(s):  
Heavy Ion ◽  
System On Chip ◽  
Single Event ◽  
Single Event Effect ◽  
On Chip ◽  
28 Nm

Single Event Effect Test Results for Candidate Spacecraft Electronics

2019 ◽  
Author(s):  
Timofei A. Maksimenko ◽  
Vasiliy S. Anashin ◽  
Anastasia A. Kalashnikova ◽  
Nikolai V. Bondarenko ◽  
Kais B. Bu-Khasan ◽  
...  
Keyword(s):  
Test Results ◽  
Single Event ◽  
Single Event Effect ◽  
Effect Test

scholarly journals A Design of Single Event Effect Test System

2021 ◽  
Vol 1971 (1) ◽  
pp. 012016
Author(s):  
Na Yan ◽  
Kun Zhang ◽  
Peiyuan Xv ◽  
Xiaodong Zhao
Keyword(s):  
Test System ◽  
Single Event ◽  
Single Event Effect ◽  
Effect Test

Single-event effects induced by medium-energy protons in 28 nm system-on-chip

2019 ◽  
Vol 30 (10) ◽  
Author(s):  
Wei-Tao Yang ◽  
Qian Yin ◽  
Yang Li ◽  
Gang Guo ◽  
Yong-Hong Li ◽  
...  
Keyword(s):  
System On Chip ◽  
Single Event ◽  
Medium Energy ◽  
Single Event Effects ◽  
On Chip ◽  
28 Nm
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