2018 International Conference on Radiation Effects of Electronic Devices (ICREED)
Latest Publications

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(FIVE YEARS 0)

H-INDEX

(FIVE YEARS 0)

Published By IEEE

9781538641354

Latest Documents Most Cited Documents Contributed Authors Related Sources Related Keywords

A Total Ionizing Dose Radiation Hardened Trench VDMOS Device

2018 International Conference on Radiation Effects of Electronic Devices (ICREED) ◽

10.1109/icreed.2018.8905101 ◽

2018 ◽

Author(s):

Wu Hao ◽

Yang Feng ◽

Xiang Fan ◽

Zheng Zhi ◽

Zhang Mingmin ◽

...

Keyword(s):

Total Ionizing Dose ◽

Radiation Hardened ◽

Dose Radiation

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A Kind of Resilient Latch Structure Base on Cross-coupled Transistors

2018 International Conference on Radiation Effects of Electronic Devices (ICREED) ◽

10.1109/icreed.2018.8905102 ◽

2018 ◽

Author(s):

Xin Liu ◽

Lei Xie ◽

Le Zhong ◽

Guoping Xiao

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A Single Event Transient Harden Structure for Flip-Flop with RC Filter

2018 International Conference on Radiation Effects of Electronic Devices (ICREED) ◽

10.1109/icreed.2018.8905068 ◽

2018 ◽

Author(s):

ZHOU Xinjie ◽

ZHOU Xiaobin ◽

LIU Zhun ◽

Tao Wei ◽

GUO Gang ◽

...

Keyword(s):

Single Event ◽

Single Event Transient ◽

Flip Flop

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Study on ASIC Single Event Soft Error Evaluation Methodology and Simulaion Analysis

2018 International Conference on Radiation Effects of Electronic Devices (ICREED) ◽

10.1109/icreed.2018.8905097 ◽

2018 ◽

Author(s):

Luo Lei ◽

Liu Yinghui ◽

Sun Yi ◽

Li Xiaoliang ◽

Yu Qingkui

Keyword(s):

Soft Error ◽

Evaluation Methodology ◽

Single Event ◽

Error Evaluation

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SEE Assessment Software Design of Processor Device

2018 International Conference on Radiation Effects of Electronic Devices (ICREED) ◽

10.1109/icreed.2018.8905106 ◽

2018 ◽

Author(s):

Hongwei Liu ◽

Qun Zhang

Keyword(s):

Software Design

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Defects Effect on InAlAs/InGaAs High Electron Mobility Transistors

2018 International Conference on Radiation Effects of Electronic Devices (ICREED) ◽

10.1109/icreed.2018.8905090 ◽

2018 ◽

Author(s):

Shu-Xiang Sun ◽

Ming-Ming Chang ◽

Ying-Hui Zhong ◽

Yu-Xiao Li ◽

Peng Ding ◽

...

Keyword(s):

Electron Mobility ◽

High Electron Mobility Transistors ◽

High Electron ◽

High Electron Mobility ◽

Electron Mobility Transistors

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Research of Radiation Effect on DC/DC Buck Converter under High Dose Rate

2018 International Conference on Radiation Effects of Electronic Devices (ICREED) ◽

10.1109/icreed.2018.8905055 ◽

2018 ◽

Author(s):

Zhong-Chao Cong ◽

Hao Chen ◽

Hui Wang ◽

Sheng-Yang Xiong ◽

Jian-Sheng Tao ◽

...

Keyword(s):

Dose Rate ◽

Radiation Effect ◽

High Dose Rate ◽

Buck Converter ◽

High Dose

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Single Event Dielectric Rupture Phenomenon in Amorphous Silicon based MIM Structures

2018 International Conference on Radiation Effects of Electronic Devices (ICREED) ◽

10.1109/icreed.2018.8905078 ◽

2018 ◽

Author(s):

Suzhen Wu ◽

Haiming Xu ◽

Ruocheng Zheng ◽

Genshen Hong ◽

Jianwei Wu ◽

...

Keyword(s):

Amorphous Silicon ◽

Single Event ◽

Silicon Based

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ICREED 2018 Conference Organizer and Committee

2018 International Conference on Radiation Effects of Electronic Devices (ICREED) ◽

10.1109/icreed.2018.8905079 ◽

2018 ◽

Keyword(s):

Conference Organizer

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A Detector Designed for Diagnosing Single Event Effect

2018 International Conference on Radiation Effects of Electronic Devices (ICREED) ◽

10.1109/icreed.2018.8905088 ◽

2018 ◽

Author(s):

T. Xiao ◽

J. S. Liu ◽

B. Wang ◽

X. Y. Hao ◽

S. P. Shao ◽

...

Keyword(s):

Single Event ◽

Single Event Effect

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2018 International Conference on Radiation Effects of Electronic Devices (ICREED)Latest Publications

TOTAL DOCUMENTS

H-INDEX

Published By IEEE

A Total Ionizing Dose Radiation Hardened Trench VDMOS Device

A Kind of Resilient Latch Structure Base on Cross-coupled Transistors

A Single Event Transient Harden Structure for Flip-Flop with RC Filter

Study on ASIC Single Event Soft Error Evaluation Methodology and Simulaion Analysis

SEE Assessment Software Design of Processor Device

Defects Effect on InAlAs/InGaAs High Electron Mobility Transistors

Research of Radiation Effect on DC/DC Buck Converter under High Dose Rate

Single Event Dielectric Rupture Phenomenon in Amorphous Silicon based MIM Structures

ICREED 2018 Conference Organizer and Committee

A Detector Designed for Diagnosing Single Event Effect

2018 International Conference on Radiation Effects of Electronic Devices (ICREED)
Latest Publications