1996 IEEE Radiation Effects Data Workshop. Workshop Record. Held in conjunction with The IEEE Nuclear and Space Radiation Effects Conference

The total dose response of NPN transistors with different package types to various irradiation conditions

1996 IEEE Radiation Effects Data Workshop. Workshop Record. Held in conjunction with The IEEE Nuclear and Space Radiation Effects Conference ◽

10.1109/redw.1996.574187 ◽

2002 ◽

Cited By ~ 4

Author(s):

S. Dowling

Keyword(s):

Total Dose ◽

Dose Response

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Heavy ions evaluation of GaAs microwave devices

1996 IEEE Radiation Effects Data Workshop. Workshop Record. Held in conjunction with The IEEE Nuclear and Space Radiation Effects Conference ◽

10.1109/redw.1996.574195 ◽

2002 ◽

Cited By ~ 2

Author(s):

C. Barillot ◽

A. Bensoussan ◽

F. Brasseau ◽

P. Calvel

Keyword(s):

Heavy Ions ◽

Microwave Devices

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Current single event effect test results for candidate spacecraft electronics

1996 IEEE Radiation Effects Data Workshop. Workshop Record. Held in conjunction with The IEEE Nuclear and Space Radiation Effects Conference ◽

10.1109/redw.1996.574184 ◽

2002 ◽

Cited By ~ 13

Author(s):

K.A. LaBel ◽

A.K. Moran ◽

D.K. Hawkins ◽

A.B. Sanders ◽

C.M. Seidleck ◽

...

Keyword(s):

Test Results ◽

Single Event ◽

Single Event Effect ◽

Effect Test

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Solar cell degradation observed by the Advanced Photovoltaic and Electronics experiments (APEX) satellite

1996 IEEE Radiation Effects Data Workshop. Workshop Record. Held in conjunction with The IEEE Nuclear and Space Radiation Effects Conference ◽

10.1109/redw.1996.574196 ◽

2002 ◽

Cited By ~ 1

Author(s):

K.P. Ray ◽

D.E. Delorey ◽

E.G. Mullen ◽

D.A. Guidice ◽

D.C. Marvin ◽

...

Keyword(s):

Solar Cell

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Dose rate and total dose noise performance of a commercial off the shelf dielectrically isolated JFET operational amplifier during irradiation

1996 IEEE Radiation Effects Data Workshop. Workshop Record. Held in conjunction with The IEEE Nuclear and Space Radiation Effects Conference ◽

10.1109/redw.1996.574181 ◽

2002 ◽

Cited By ~ 3

Author(s):

D.M. Hiemstra

Keyword(s):

Total Dose ◽

Dose Rate ◽

Operational Amplifier ◽

Noise Performance ◽

Commercial Off The Shelf

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"RADON-5E" portable pulsed laser simulator: description, qualification technique and results, dosimetry procedure

1996 IEEE Radiation Effects Data Workshop. Workshop Record. Held in conjunction with The IEEE Nuclear and Space Radiation Effects Conference ◽

10.1109/redw.1996.574188 ◽

2002 ◽

Cited By ~ 13

Author(s):

A.Y. Nikiforov ◽

O.B. Mavritsky ◽

A.N. Egorov ◽

V.S. Figurov ◽

V.A. Telets ◽

...

Keyword(s):

Pulsed Laser

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Update of single event failure in power MOSFETs

1996 IEEE Radiation Effects Data Workshop. Workshop Record. Held in conjunction with The IEEE Nuclear and Space Radiation Effects Conference ◽

10.1109/redw.1996.574191 ◽

2002 ◽

Cited By ~ 12

Author(s):

D.K. Nichols ◽

J.R. Coss ◽

T. Miyahira ◽

J. Titus ◽

D. Oberg ◽

...

Keyword(s):

Single Event ◽

Power Mosfets

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Radiation effects in analog CMOS analog-to-digital converters

1996 IEEE Radiation Effects Data Workshop. Workshop Record. Held in conjunction with The IEEE Nuclear and Space Radiation Effects Conference ◽

10.1109/redw.1996.574182 ◽

2002 ◽

Cited By ~ 9

Author(s):

T.L. Turflinger ◽

M.V. Davey ◽

J.P. Bings

Keyword(s):

Radiation Effects ◽

Analog To Digital Converters ◽

Analog To Digital ◽

Analog Cmos

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Opportunities for single event and other radiation effects testing and research at the Indiana University Cyclotron Facility

1996 IEEE Radiation Effects Data Workshop. Workshop Record. Held in conjunction with The IEEE Nuclear and Space Radiation Effects Conference ◽

10.1109/redw.1996.574194 ◽

2002 ◽

Cited By ~ 16

Author(s):

C.C. Foster ◽

S.L. Casey ◽

A.L. Johnson ◽

P. Miesle ◽

N. Sifri ◽

...

Keyword(s):

Radiation Effects ◽

Single Event ◽

Indiana University

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Total dose radiation hard 0.5 μm SOI CMOS transistors and 256 K SRAMs

1996 IEEE Radiation Effects Data Workshop. Workshop Record. Held in conjunction with The IEEE Nuclear and Space Radiation Effects Conference ◽

10.1109/redw.1996.574190 ◽

2002 ◽

Cited By ~ 1

Author(s):

S.T. Liu ◽

W.C. Jenkins

Keyword(s):

Total Dose ◽

Cmos Transistors ◽

Radiation Hard ◽

Dose Radiation ◽

Soi Cmos

Download Full-text

1996 IEEE Radiation Effects Data Workshop. Workshop Record. Held in conjunction with The IEEE Nuclear and Space Radiation Effects Conference
Latest Publications

TOTAL DOCUMENTS

H-INDEX

Published By IEEE

The total dose response of NPN transistors with different package types to various irradiation conditions

Heavy ions evaluation of GaAs microwave devices

Current single event effect test results for candidate spacecraft electronics

Solar cell degradation observed by the Advanced Photovoltaic and Electronics experiments (APEX) satellite

Dose rate and total dose noise performance of a commercial off the shelf dielectrically isolated JFET operational amplifier during irradiation

"RADON-5E" portable pulsed laser simulator: description, qualification technique and results, dosimetry procedure

Update of single event failure in power MOSFETs

Radiation effects in analog CMOS analog-to-digital converters

Opportunities for single event and other radiation effects testing and research at the Indiana University Cyclotron Facility

Total dose radiation hard 0.5 μm SOI CMOS transistors and 256 K SRAMs

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1996 IEEE Radiation Effects Data Workshop. Workshop Record. Held in conjunction with The IEEE Nuclear and Space Radiation Effects ConferenceLatest Publications

TOTAL DOCUMENTS

H-INDEX

Published By IEEE

The total dose response of NPN transistors with different package types to various irradiation conditions

Heavy ions evaluation of GaAs microwave devices

Current single event effect test results for candidate spacecraft electronics

Solar cell degradation observed by the Advanced Photovoltaic and Electronics experiments (APEX) satellite

Dose rate and total dose noise performance of a commercial off the shelf dielectrically isolated JFET operational amplifier during irradiation

"RADON-5E" portable pulsed laser simulator: description, qualification technique and results, dosimetry procedure

Update of single event failure in power MOSFETs

Radiation effects in analog CMOS analog-to-digital converters

Opportunities for single event and other radiation effects testing and research at the Indiana University Cyclotron Facility

Total dose radiation hard 0.5 μm SOI CMOS transistors and 256 K SRAMs

1996 IEEE Radiation Effects Data Workshop. Workshop Record. Held in conjunction with The IEEE Nuclear and Space Radiation Effects Conference
Latest Publications