1997 IEEE Radiation Effects Data Workshop NSREC Snowmass 1997. Workshop Record Held in conjunction with IEEE Nuclear and Space Radiation Effects Conference

Common-source TLD and RADFET characterization of Co-60, Cs-137, and X-ray irradiation sources [bipolar linear ICs]

1997 IEEE Radiation Effects Data Workshop NSREC Snowmass 1997. Workshop Record Held in conjunction with IEEE Nuclear and Space Radiation Effects Conference ◽

10.1109/redw.1997.629793 ◽

2002 ◽

Cited By ~ 2

Author(s):

M. Simons ◽

R.L. Pease ◽

D.M. Fleetwood ◽

J.R. Schwank ◽

M.F. Krzesniak ◽

...

Keyword(s):

Common Source ◽

X Ray

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The SEU in pulse width modulation controllers with soft start and shutdown circuits

1997 IEEE Radiation Effects Data Workshop NSREC Snowmass 1997. Workshop Record Held in conjunction with IEEE Nuclear and Space Radiation Effects Conference ◽

10.1109/redw.1997.629801 ◽

2002 ◽

Cited By ~ 10

Author(s):

S.H. Penzin ◽

W.R. Crain ◽

K.B. Crawford ◽

S.J. Hansel ◽

R. Koga

Keyword(s):

Pulse Width ◽

Pulse Width Modulation ◽

Soft Start

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Proton displacement damage in optocouplers

1997 IEEE Radiation Effects Data Workshop NSREC Snowmass 1997. Workshop Record Held in conjunction with IEEE Nuclear and Space Radiation Effects Conference ◽

10.1109/redw.1997.629810 ◽

2002 ◽

Cited By ~ 15

Author(s):

M. D'Ordine

Keyword(s):

Displacement Damage

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The single event upset characteristics of the 486-DX4 microprocessor

1997 IEEE Radiation Effects Data Workshop NSREC Snowmass 1997. Workshop Record Held in conjunction with IEEE Nuclear and Space Radiation Effects Conference ◽

10.1109/redw.1997.629797 ◽

2002 ◽

Cited By ~ 6

Author(s):

C.K. Kouba ◽

Gwan Choi

Keyword(s):

Single Event Upset ◽

Single Event

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Total dose performance of a commercial off the shelf ultra-low noise precision bipolar operational amplifier during irradiation

1997 IEEE Radiation Effects Data Workshop NSREC Snowmass 1997. Workshop Record Held in conjunction with IEEE Nuclear and Space Radiation Effects Conference ◽

10.1109/redw.1997.629802 ◽

2002 ◽

Cited By ~ 5

Author(s):

D.M. Hiemstra

Keyword(s):

Total Dose ◽

Operational Amplifier ◽

Low Noise ◽

Commercial Off The Shelf ◽

Ultra Low Noise

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Thin-film thermo-resistor radiation hardness experimental results

1997 IEEE Radiation Effects Data Workshop NSREC Snowmass 1997. Workshop Record Held in conjunction with IEEE Nuclear and Space Radiation Effects Conference ◽

10.1109/redw.1997.629795 ◽

2002 ◽

Cited By ~ 1

Author(s):

A.Y. Nikiforov ◽

V.A. Telets ◽

V.S. Figurov

Keyword(s):

Thin Film ◽

Radiation Hardness ◽

Experimental Results

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Ionizing radiation response of an amorphous silicon based antifuse

1997 IEEE Radiation Effects Data Workshop NSREC Snowmass 1997. Workshop Record Held in conjunction with IEEE Nuclear and Space Radiation Effects Conference ◽

10.1109/redw.1997.629806 ◽

2002 ◽

Author(s):

J.M. Benedetto ◽

C.C. Hafer

Keyword(s):

Ionizing Radiation ◽

Amorphous Silicon ◽

Radiation Response ◽

Silicon Based

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Total dose response of Maxim analog multiplexers at two dose rates

1997 IEEE Radiation Effects Data Workshop NSREC Snowmass 1997. Workshop Record Held in conjunction with IEEE Nuclear and Space Radiation Effects Conference ◽

10.1109/redw.1997.629803 ◽

2002 ◽

Cited By ~ 3

Author(s):

R. Pease ◽

W. Kemp ◽

J. Chavez ◽

N. Islam ◽

W. Shedd

Keyword(s):

Total Dose ◽

Dose Response ◽

Dose Rates

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Neutron SEU trends in avionics [memory chips]

1997 IEEE Radiation Effects Data Workshop NSREC Snowmass 1997. Workshop Record Held in conjunction with IEEE Nuclear and Space Radiation Effects Conference ◽

10.1109/redw.1997.629800 ◽

2002 ◽

Cited By ~ 5

Author(s):

N. Kerness ◽

A. Taber

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Honeywell radiation hardened 32-bit processor central processing unit, floating point processor, and cache memory dose rate and single event effects test results

1997 IEEE Radiation Effects Data Workshop NSREC Snowmass 1997. Workshop Record Held in conjunction with IEEE Nuclear and Space Radiation Effects Conference ◽

10.1109/redw.1997.629808 ◽

2002 ◽

Cited By ~ 4

Author(s):

G.R. Brown ◽

L.F. Hoffmann ◽

S.C. Leavy ◽

J.A. Mogensen ◽

J. Brichacek

Keyword(s):

Dose Rate ◽

Central Processing Unit ◽

Cache Memory ◽

Floating Point ◽

Processing Unit ◽

Test Results ◽

Single Event ◽

Single Event Effects ◽

Central Processing ◽

Radiation Hardened

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1997 IEEE Radiation Effects Data Workshop NSREC Snowmass 1997. Workshop Record Held in conjunction with IEEE Nuclear and Space Radiation Effects Conference
Latest Publications

TOTAL DOCUMENTS

H-INDEX

Published By IEEE

Common-source TLD and RADFET characterization of Co-60, Cs-137, and X-ray irradiation sources [bipolar linear ICs]

The SEU in pulse width modulation controllers with soft start and shutdown circuits

Proton displacement damage in optocouplers

The single event upset characteristics of the 486-DX4 microprocessor

Total dose performance of a commercial off the shelf ultra-low noise precision bipolar operational amplifier during irradiation

Thin-film thermo-resistor radiation hardness experimental results

Ionizing radiation response of an amorphous silicon based antifuse

Total dose response of Maxim analog multiplexers at two dose rates

Neutron SEU trends in avionics [memory chips]

Honeywell radiation hardened 32-bit processor central processing unit, floating point processor, and cache memory dose rate and single event effects test results

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1997 IEEE Radiation Effects Data Workshop NSREC Snowmass 1997. Workshop Record Held in conjunction with IEEE Nuclear and Space Radiation Effects ConferenceLatest Publications

TOTAL DOCUMENTS

H-INDEX

Published By IEEE

Common-source TLD and RADFET characterization of Co-60, Cs-137, and X-ray irradiation sources [bipolar linear ICs]

The SEU in pulse width modulation controllers with soft start and shutdown circuits

Proton displacement damage in optocouplers

The single event upset characteristics of the 486-DX4 microprocessor

Total dose performance of a commercial off the shelf ultra-low noise precision bipolar operational amplifier during irradiation

Thin-film thermo-resistor radiation hardness experimental results

Ionizing radiation response of an amorphous silicon based antifuse

Total dose response of Maxim analog multiplexers at two dose rates

Neutron SEU trends in avionics [memory chips]

Honeywell radiation hardened 32-bit processor central processing unit, floating point processor, and cache memory dose rate and single event effects test results

1997 IEEE Radiation Effects Data Workshop NSREC Snowmass 1997. Workshop Record Held in conjunction with IEEE Nuclear and Space Radiation Effects Conference
Latest Publications