Design of 2xVDD-tolerant mixed-voltage I/O buffer against gate-oxide reliability and hot-carrier degradation

2010 ◽  
Vol 50 (1) ◽  
pp. 48-56 ◽  
Author(s):  
Hui-Wen Tsai ◽  
Ming-Dou Ker
Keyword(s):  
Gate Oxide ◽  
Hot Carrier ◽  
Oxide Reliability ◽  
Hot Carrier Degradation

Characterization of hot carrier degradation within the gate oxide of short channel MOSFET's

1991 ◽  
Vol 74 (5) ◽  
pp. 379-387
Author(s):  
R. Mahnkopf ◽  
G. Przyrembel ◽  
H. G. Wagemann
Keyword(s):  
Gate Oxide ◽  
Short Channel ◽  
Hot Carrier ◽  
Hot Carrier Degradation

Hot-carrier degradation for 90 nm gate length LDD-NMOSFET with ultra-thin gate oxide under low gate voltage stress

2007 ◽  
Vol 16 (3) ◽  
pp. 821-825
Author(s):  
Chen Hai-Feng ◽  
Hao Yue ◽  
Ma Xiao-Hua ◽  
Li Kang ◽  
Ni Jin-Yu
Keyword(s):  
Gate Voltage ◽  
Gate Oxide ◽  
Gate Length ◽  
Hot Carrier ◽  
Voltage Stress ◽  
Thin Gate Oxide ◽  
Hot Carrier Degradation

Hot-carrier degradation mechanism for p-type symmetric LDMOS transistor with thick gate oxide

2012 ◽  
Vol 48 (24) ◽  
pp. 1545-1546 ◽  
Author(s):  
Siyang Liu ◽  
Qinsong Qian ◽  
Weijun Wan ◽  
Tingting Huang ◽  
Weifeng Sun
Keyword(s):  
Degradation Mechanism ◽  
Gate Oxide ◽  
Hot Carrier ◽  
P Type ◽  
Hot Carrier Degradation

scholarly journals Characterization of hot carrier degradation within the gate oxide of short channel MOSFET's

1991 ◽  
Vol 75 (1) ◽  
pp. 8-8
Author(s):  
Beitrag R. Mahnkopf ◽  
G. Przyrembel ◽  
H. G. Wagemann
Keyword(s):  
Gate Oxide ◽  
Short Channel ◽  
Hot Carrier ◽  
Hot Carrier Degradation
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