scholarly journals Characterization of hot carrier degradation within the gate oxide of short channel MOSFET's

1991 ◽  
Vol 75 (1) ◽  
pp. 8-8
Author(s):  
Beitrag R. Mahnkopf ◽  
G. Przyrembel ◽  
H. G. Wagemann
Keyword(s):  
Gate Oxide ◽  
Short Channel ◽  
Hot Carrier ◽  
Hot Carrier Degradation

Characterization of hot carrier degradation within the gate oxide of short channel MOSFET's

1991 ◽  
Vol 74 (5) ◽  
pp. 379-387
Author(s):  
R. Mahnkopf ◽  
G. Przyrembel ◽  
H. G. Wagemann
Keyword(s):  
Gate Oxide ◽  
Short Channel ◽  
Hot Carrier ◽  
Hot Carrier Degradation

Comparison of DC/AC Hot Carrier Degradation between Short Channel Si Bulk and SiGe SOI p-FinFETs

2021 ◽  
Author(s):  
Hao Chang ◽  
Yongkui Zhang ◽  
Longda Zhou ◽  
Zhigang Ji ◽  
Hong Yang ◽  
...  
Keyword(s):  
Short Channel ◽  
Hot Carrier ◽  
Hot Carrier Degradation

Channel hot-carrier degradation in pMOS and nMOS short channel transistors with high-k dielectric stack

2010 ◽  
Vol 87 (1) ◽  
pp. 47-50 ◽  
Author(s):  
E. Amat ◽  
T. Kauerauf ◽  
R. Degraeve ◽  
R. Rodríguez ◽  
M. Nafría ◽  
...  
Keyword(s):  
Short Channel ◽  
Hot Carrier ◽  
High K ◽  
High K Dielectric ◽  
Hot Carrier Degradation

Simulation of the hot-carrier degradation in short channel transistors with high-K dielectric

2010 ◽  
Vol 23 (4-5) ◽  
pp. 315-323 ◽  
Author(s):  
E. Amat ◽  
T. Kauerauf ◽  
R. Degraeve ◽  
R. Rodríguez ◽  
M. Nafría ◽  
...  
Keyword(s):  
Short Channel ◽  
Hot Carrier ◽  
High K ◽  
High K Dielectric ◽  
Hot Carrier Degradation

Channel hot-carrier degradation under AC stress in short channel nMOS devices with high-k gate stacks

2009 ◽  
Vol 86 (7-9) ◽  
pp. 1908-1910 ◽  
Author(s):  
E. Amat ◽  
R. Rodríguez ◽  
M. Nafría ◽  
X. Aymerich
Keyword(s):  
Gate Stacks ◽  
Short Channel ◽  
Hot Carrier ◽  
High K ◽  
Hot Carrier Degradation

Hot-carrier degradation for 90 nm gate length LDD-NMOSFET with ultra-thin gate oxide under low gate voltage stress

2007 ◽  
Vol 16 (3) ◽  
pp. 821-825
Author(s):  
Chen Hai-Feng ◽  
Hao Yue ◽  
Ma Xiao-Hua ◽  
Li Kang ◽  
Ni Jin-Yu
Keyword(s):  
Gate Voltage ◽  
Gate Oxide ◽  
Gate Length ◽  
Hot Carrier ◽  
Voltage Stress ◽  
Thin Gate Oxide ◽  
Hot Carrier Degradation

Hot carrier degradation modeling of short-channel n-FinFETs

2015 ◽  
Author(s):  
I. Messaris ◽  
N. Fasarakis ◽  
T. A. Karatsori ◽  
A. Tsormpatzoglou ◽  
G. Ghibaudo ◽  
...  
Keyword(s):  
Short Channel ◽  
Hot Carrier ◽  
Degradation Modeling ◽  
Hot Carrier Degradation
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