Negative bias temperature instabilities in HfSiO(N)-based MOSFETs: Electrical characterization and modeling

2007 ◽  
Vol 47 (6) ◽  
pp. 880-889 ◽  
Author(s):  
M. Houssa ◽  
M. Aoulaiche ◽  
S. De Gendt ◽  
G. Groeseneken ◽  
M.M. Heyns
Keyword(s):  
Electrical Characterization ◽  
Negative Bias ◽  
Bias Temperature Instabilities

Negative Bias Temperature Instabilities in SiO[sub 2]/HfO[sub 2]-Based Hole Channel FETs

2004 ◽  
Vol 151 (12) ◽  
pp. F288 ◽  
Author(s):  
M. Houssa ◽  
S. De Gendt ◽  
G. Groeseneken ◽  
M. M. Heyns
Keyword(s):  
Negative Bias ◽  
Bias Temperature Instabilities

Influence of various process steps on the reliability of PMOSFETs submitted to negative bias temperature instabilities

2009 ◽  
Vol 49 (9-11) ◽  
pp. 1008-1012 ◽  
Author(s):  
Christelle Bénard ◽  
Gaëtan Math ◽  
Pascal Fornara ◽  
Jean-Luc Ogier ◽  
Didier Goguenheim
Keyword(s):  
Negative Bias ◽  
Bias Temperature Instabilities

Reaction-dispersive proton transport model for negative bias temperature instabilities

2005 ◽  
Vol 86 (9) ◽  
pp. 093506 ◽  
Author(s):  
M. Houssa ◽  
M. Aoulaiche ◽  
S. De Gendt ◽  
G. Groeseneken ◽  
M. M. Heyns ◽  
...  
Keyword(s):  
Proton Transport ◽  
Transport Model ◽  
Negative Bias ◽  
Bias Temperature Instabilities
Sign in / Sign up

Export Citation Format

Share Document