Reduced temperature dependence of hot carrier degradation in deuterated nMOSFETs

2006 ◽  
Vol 46 (9-11) ◽  
pp. 1617-1622 ◽  
Author(s):  
C. Salm ◽  
A.J. Hof ◽  
F.G. Kuper ◽  
J. Schmitz
Keyword(s):  
Temperature Dependence ◽  
Hot Carrier ◽  
Reduced Temperature ◽  
Hot Carrier Degradation

Temperature Dependence of Threshold Voltage and Hot Carrier Degradation of Dynamic Threshold SOI-pMOSFETs

2003 ◽  
Author(s):  
Yao-Jen Lee ◽  
Tien-Sheng Chao ◽  
Chun-Yang Huang ◽  
Horng-Chih Lin ◽  
Tiao-Yuan Huang
Keyword(s):  
Temperature Dependence ◽  
Threshold Voltage ◽  
Dynamic Threshold ◽  
Hot Carrier ◽  
Hot Carrier Degradation

Temperature dependence of the channel hot-carrier degradation of n-channel MOSFET's

1990 ◽  
Vol 37 (4) ◽  
pp. 980-993 ◽  
Author(s):  
P. Heremans ◽  
G. Van den Bosch ◽  
R. Bellens ◽  
G. Groeseneken ◽  
H.E. Maes
Keyword(s):  
Temperature Dependence ◽  
Hot Carrier ◽  
Hot Carrier Degradation

Understanding of the temperature dependence of channel hot-carrier degradation in the range 77 K to 300 K

2003 ◽  
Author(s):  
P. Heremans ◽  
G. van den Bosch ◽  
R. Bellens ◽  
G. Groeseneken ◽  
H.E. Maes
Keyword(s):  
Temperature Dependence ◽  
Hot Carrier ◽  
Hot Carrier Degradation

ANALYSIS OF HOT CARRIER DEGRADATION IN AC STRESSED N-CHANNEL MOS TRANSISTORS USING THE CHARGE PUMPING TECHNIQUE

1988 ◽  
Vol 49 (C4) ◽  
pp. C4-651-C4-655 ◽  
Author(s):  
R. BELLENS ◽  
P. HEREMANS ◽  
G. GROESENEKEN ◽  
H. E. MAES
Keyword(s):  
Mos Transistors ◽  
Charge Pumping ◽  
Hot Carrier ◽  
Hot Carrier Degradation
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