Investigation of the Temperature Dependence of Hot-Carrier Degradation in Si MOSFETs Using Spectroscopic Charge Pumping

2020 ◽  
Vol 67 (10) ◽  
pp. 4092-4098
Author(s):  
Bernhard Ruch ◽  
Gregor Pobegen ◽  
Tibor Grasser
Keyword(s):  
Temperature Dependence ◽  
Charge Pumping ◽  
Hot Carrier ◽  
Hot Carrier Degradation

ANALYSIS OF HOT CARRIER DEGRADATION IN AC STRESSED N-CHANNEL MOS TRANSISTORS USING THE CHARGE PUMPING TECHNIQUE

1988 ◽  
Vol 49 (C4) ◽  
pp. C4-651-C4-655 ◽  
Author(s):  
R. BELLENS ◽  
P. HEREMANS ◽  
G. GROESENEKEN ◽  
H. E. MAES
Keyword(s):  
Mos Transistors ◽  
Charge Pumping ◽  
Hot Carrier ◽  
Hot Carrier Degradation

Temperature Dependence of Threshold Voltage and Hot Carrier Degradation of Dynamic Threshold SOI-pMOSFETs

2003 ◽  
Author(s):  
Yao-Jen Lee ◽  
Tien-Sheng Chao ◽  
Chun-Yang Huang ◽  
Horng-Chih Lin ◽  
Tiao-Yuan Huang
Keyword(s):  
Temperature Dependence ◽  
Threshold Voltage ◽  
Dynamic Threshold ◽  
Hot Carrier ◽  
Hot Carrier Degradation

Temperature dependence of the channel hot-carrier degradation of n-channel MOSFET's

1990 ◽  
Vol 37 (4) ◽  
pp. 980-993 ◽  
Author(s):  
P. Heremans ◽  
G. Van den Bosch ◽  
R. Bellens ◽  
G. Groeseneken ◽  
H.E. Maes
Keyword(s):  
Temperature Dependence ◽  
Hot Carrier ◽  
Hot Carrier Degradation
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