Temperature dependence of hot-carrier degradation in silicon-on-insulator dynamic threshold voltage MOS transistors

2002 ◽  
Vol 23 (11) ◽  
pp. 673-675 ◽  
Author(s):  
Jae-Ki Lee ◽  
Nag-Jong Choi ◽  
Chong-Gun Yu ◽  
J.-P. Colinge ◽  
Jong-Tae Park
Keyword(s):  
Temperature Dependence ◽  
Threshold Voltage ◽  
Silicon On Insulator ◽  
Dynamic Threshold ◽  
Mos Transistors ◽  
Hot Carrier ◽  
Hot Carrier Degradation

Temperature Dependence of Threshold Voltage and Hot Carrier Degradation of Dynamic Threshold SOI-pMOSFETs

2003 ◽  
Author(s):  
Yao-Jen Lee ◽  
Tien-Sheng Chao ◽  
Chun-Yang Huang ◽  
Horng-Chih Lin ◽  
Tiao-Yuan Huang
Keyword(s):  
Temperature Dependence ◽  
Threshold Voltage ◽  
Dynamic Threshold ◽  
Hot Carrier ◽  
Hot Carrier Degradation

ANALYSIS OF HOT CARRIER DEGRADATION IN AC STRESSED N-CHANNEL MOS TRANSISTORS USING THE CHARGE PUMPING TECHNIQUE

1988 ◽  
Vol 49 (C4) ◽  
pp. C4-651-C4-655 ◽  
Author(s):  
R. BELLENS ◽  
P. HEREMANS ◽  
G. GROESENEKEN ◽  
H. E. MAES
Keyword(s):  
Mos Transistors ◽  
Charge Pumping ◽  
Hot Carrier ◽  
Hot Carrier Degradation
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