High aspect ratio sub-micron trenches on silicon-on-insulator and bulk silicon

2011 ◽  
Vol 88 (8) ◽  
pp. 2556-2558 ◽  
Author(s):  
M. Hermersdorf ◽  
C. Hibert ◽  
D. Grogg ◽  
A.M. Ionescu
2007 ◽  
Vol 51 (10) ◽  
pp. 1391-1397 ◽  
Author(s):  
Leo Petrossian ◽  
Seth J. Wilk ◽  
Punarvasu Joshi ◽  
Sahar Hihath ◽  
Jonathan D. Posner ◽  
...  

2007 ◽  
Vol 19 (11) ◽  
pp. 855-857 ◽  
Author(s):  
J. H. Schmid ◽  
B. Lamontagne ◽  
P. Cheben ◽  
A. Delage ◽  
S. Janz ◽  
...  

2021 ◽  
Vol 119 (21) ◽  
pp. 211106
Author(s):  
Kirill Bronnikov ◽  
Alexander Dostovalov ◽  
Vadim Terentyev ◽  
Sergey Babin ◽  
Aleksey Kozlov ◽  
...  

Micromachines ◽  
2021 ◽  
Vol 12 (12) ◽  
pp. 1481
Author(s):  
Adrian J. T. Teo ◽  
King Ho Holden Li

A high-aspect-ratio three-dimensionally (3D) stacked comb structure for micromirror application is demonstrated by wafer bonding technology in CMOS-compatible processes in this work. A vertically stacked comb structure is designed to circumvent any misalignment issues that could arise from multiple wafer bonding. These out-of-plane comb drives are used for the bias actuation to achieve a larger tilt angle for micromirrors. The high-aspect-ratio mechanical structure is realized by the deep reactive ion etching of silicon, and the notching effect in silicon-on-insulator (SOI) wafers is minimized. The low-temperature bonding of two patterned wafers is achieved with fusion bonding, and a high bond strength up to 2.5 J/m2 is obtained, which sustains subsequent processing steps. Furthermore, the dependency of resonant frequency on device dimensions is studied systematically, which provides useful guidelines for future design and application. A finalized device fabricated here was also tested to have a resonant frequency of 17.57 kHz and a tilt angle of 70° under an AC bias voltage of 2 V.


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