Model-based feedback controller design for dual actuated atomic force microscopy

S. Kuiper; G. Schitter

doi:10.1016/j.mechatronics.2011.08.003

Model-based feedback controller design for dual actuated atomic force microscopy

Mechatronics ◽

10.1016/j.mechatronics.2011.08.003 ◽

2012 ◽

Vol 22 (3) ◽

pp. 327-337 ◽

Cited By ~ 31

Author(s):

S. Kuiper ◽

G. Schitter

Keyword(s):

Atomic Force Microscopy ◽

Controller Design ◽

Feedback Controller ◽

Force Microscopy ◽

Model Based ◽

Atomic Force

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A double velocity feedback controller design for high speed atomic force microscopy

2013 IEEE International Conference on Control Applications (CCA) ◽

10.1109/cca.2013.6662790 ◽

2013 ◽

Cited By ~ 1

Author(s):

Sajal K. Das ◽

Hemanshu R. Pota ◽

Ian R. Petersen

Keyword(s):

Atomic Force Microscopy ◽

High Speed ◽

Controller Design ◽

Feedback Controller ◽

Velocity Feedback ◽

Force Microscopy ◽

Atomic Force

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Modeling and Controller Design of a Precision Hybrid Scanner for Application in Large Measurement-Range Atomic Force Microscopy

IEEE Transactions on Industrial Electronics ◽

10.1109/tie.2013.2279352 ◽

2014 ◽

Vol 61 (7) ◽

pp. 3704-3712 ◽

Cited By ~ 24

Author(s):

Jim-Wei Wu ◽

Kuan-Chia Huang ◽

Ming-Li Chiang ◽

Mei-Yung Chen ◽

Li-Chen Fu

Keyword(s):

Atomic Force Microscopy ◽

Controller Design ◽

Measurement Range ◽

Force Microscopy ◽

Atomic Force ◽

Large Measurement ◽

Hybrid Scanner

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Hysteresis Compensation and Adaptive Controller Design for a Piezoceramic Actuator System in Atomic Force Microscopy

Asian Journal of Control ◽

10.1002/asjc.453 ◽

2011 ◽

Vol 14 (4) ◽

pp. 1012-1027 ◽

Cited By ~ 19

Author(s):

Ping-Lang Yen ◽

Mu-Tian Yan ◽

Yil Chen

Keyword(s):

Atomic Force Microscopy ◽

Controller Design ◽

Adaptive Controller ◽

Piezoceramic Actuator ◽

Force Microscopy ◽

Hysteresis Compensation ◽

Atomic Force ◽

Actuator System

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Parameter Self-Turning Fuzzy PID Controller Design for Atomic Force Microscopy in Z-Axis

2018 IEEE 8th Annual International Conference on CYBER Technology in Automation, Control, and Intelligent Systems (CYBER) ◽

10.1109/cyber.2018.8688045 ◽

2018 ◽

Author(s):

Yinan Wu ◽

Yongchun Fang

Keyword(s):

Atomic Force Microscopy ◽

Pid Controller ◽

Controller Design ◽

Fuzzy Pid ◽

Force Microscopy ◽

Fuzzy Pid Controller ◽

Atomic Force ◽

Pid Controller Design

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Model-based extraction of material properties in multifrequency atomic force microscopy

Physical Review B ◽

10.1103/physrevb.85.195449 ◽

2012 ◽

Vol 85 (19) ◽

Cited By ~ 49

Author(s):

Daniel Forchheimer ◽

Daniel Platz ◽

Erik A. Tholén ◽

David B. Haviland

Keyword(s):

Atomic Force Microscopy ◽

Material Properties ◽

Force Microscopy ◽

Model Based ◽

Atomic Force

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Model-Based Identification of Nanomechanical Properties in Atomic Force Microscopy: Theory and Experiments

IEEE Transactions on Control Systems Technology ◽

10.1109/tcst.2018.2847644 ◽

2019 ◽

Vol 27 (5) ◽

pp. 2045-2057 ◽

Cited By ~ 1

Author(s):

Michael R. P. Ragazzon ◽

Jan Tommy Gravdahl ◽

Kristin Y. Pettersen

Keyword(s):

Atomic Force Microscopy ◽

Force Microscopy ◽

Nanomechanical Properties ◽

Model Based ◽

Atomic Force ◽

Theory And Experiments

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Towards Integrated Design of a Robust Feedback Controller and Topography Estimator for Atomic Force Microscopy

IFAC Proceedings Volumes ◽

10.3182/20110828-6-it-1002.01619 ◽

2011 ◽

Vol 44 (1) ◽

pp. 12709-12714 ◽

Cited By ~ 2

Author(s):

Stefan Kuiper ◽

Paul M.J. Van den Hof ◽

Georg Schitter

Keyword(s):

Atomic Force Microscopy ◽

Integrated Design ◽

Feedback Controller ◽

Force Microscopy ◽

Atomic Force

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Integrated design of the feedback controller and topography estimator for atomic force microscopy

Control Engineering Practice ◽

10.1016/j.conengprac.2013.03.006 ◽

2013 ◽

Vol 21 (8) ◽

pp. 1110-1120 ◽

Cited By ~ 5

Author(s):

S. Kuiper ◽

P.M.J. Van den Hof ◽

G. Schitter

Keyword(s):

Atomic Force Microscopy ◽

Integrated Design ◽

Feedback Controller ◽

Force Microscopy ◽

Atomic Force

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Model-based topography estimation in trolling mode atomic force microscopy

Applied Mathematical Modelling ◽

10.1016/j.apm.2019.08.014 ◽

2020 ◽

Vol 77 ◽

pp. 1025-1040 ◽

Cited By ~ 1

Author(s):

Milad Seifnejad Haghighi ◽

Mohammadreza Sajjadi ◽

Hossein Nejat Pishkenari

Keyword(s):

Atomic Force Microscopy ◽

Force Microscopy ◽

Model Based ◽

Atomic Force ◽

Mode Atomic Force Microscopy

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Data-Driven Controller Design for Atomic-Force Microscopy

IFAC-PapersOnLine ◽

10.1016/j.ifacol.2017.08.1972 ◽

2017 ◽

Vol 50 (1) ◽

pp. 10437-10442 ◽

Cited By ~ 2

Author(s):

Christoph Kammer ◽

Adrian P. Nievergelt ◽

Georg E. Fantner ◽

Alireza Karimi

Keyword(s):

Atomic Force Microscopy ◽

Controller Design ◽

Data Driven ◽

Force Microscopy ◽

Atomic Force

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