Model-based extraction of material properties in multifrequency atomic force microscopy

2012 ◽  
Vol 85 (19) ◽  
Author(s):  
Daniel Forchheimer ◽  
Daniel Platz ◽  
Erik A. Tholén ◽  
David B. Haviland
Keyword(s):  
Atomic Force Microscopy ◽  
Material Properties ◽  
Force Microscopy ◽  
Model Based ◽  
Atomic Force

scholarly journals Combining adhesive contact mechanics with a viscoelastic material model to probe local material properties by AFM

Soft Matter ◽  
2018 ◽  
Vol 14 (1) ◽  
pp. 140-150 ◽  
Author(s):  
Christian Ganser ◽  
Caterina Czibula ◽  
Daniel Tscharnuter ◽  
Thomas Schöberl ◽  
Christian Teichert ◽  
...  
Keyword(s):  
Surface Roughness ◽  
Atomic Force Microscopy ◽  
Viscoelastic Material ◽  
Material Properties ◽  
Material Model ◽  
Adhesive Contact ◽  
Force Microscopy ◽  
Atomic Force ◽  
Local Material ◽  
Local Material Properties

We present an atomic force microscopy based method to study viscoelastic material properties at low indentation depths with non-negligible adhesion and surface roughness.

Model-based topography estimation in trolling mode atomic force microscopy

2020 ◽  
Vol 77 ◽  
pp. 1025-1040 ◽  
Author(s):  
Milad Seifnejad Haghighi ◽  
Mohammadreza Sajjadi ◽  
Hossein Nejat Pishkenari
Keyword(s):  
Atomic Force Microscopy ◽  
Force Microscopy ◽  
Model Based ◽  
Atomic Force ◽  
Mode Atomic Force Microscopy

Localized Material Properties Through Nonlinear Dynamics Based Atomic Force Microscopy

2010 ◽  
Author(s):  
Wei Huang ◽  
Andrew J. Dick
Keyword(s):  
Atomic Force Microscopy ◽  
Material Properties ◽  
Period Doubling ◽  
Nonlinear Behavior ◽  
Separation Distance ◽  
Resonance Excitation ◽  
Current Effort ◽  
Force Microscopy ◽  
Atomic Force ◽  
Local Material Properties

Due to the intrinsic nonlinearity of the tip-sample interaction forces that are utilized in atomic force microscopy, nonlinear behavior can be observed even under the most ‘ideal’ conditions. While the standard operating modes of the atomic force microscope (AFM) have been developed to minimize this nonlinear behavior, the authors’ work focuses on utilizing a nonlinear response of the AFM probe associated with off-resonance excitation in order to measure local material properties of the sample. Previously, period-doubling bifurcations were identified and studied for an off-resonance excitation condition of two-and-a-half times the fundamental frequency. A relationship was identified between the characteristics of the qualitative response transition and the properties of the probe and sample. For a given probe, the critical separation distance where the period-doubling bifurcation occurs is influenced by the local modulus properties of the sample. This paper details the current effort studying this relationship with the goal of developing a new AFM operation mode for obtaining localized material properties by scanning the sample. The influence of different system parameters on this relationship is studied and preliminary simulation results are presented for a simple scanning process.

Combined atomic force microscopy (AFM) and traction force microscopy (TFM) reveals a correlation between viscoelastic material properties and contractile prestress of living cells

Soft Matter ◽  
2019 ◽  
Vol 15 (8) ◽  
pp. 1721-1729 ◽  
Author(s):  
Nicolas Schierbaum ◽  
Johannes Rheinlaender ◽  
Tilman E. Schäffer
Keyword(s):  
Atomic Force Microscopy ◽  
Viscoelastic Material ◽  
Material Properties ◽  
Traction Force ◽  
Living Cells ◽  
Traction Force Microscopy ◽  
Force Microscopy ◽  
Atomic Force

Combined AFM with TFM is a powerful tool to simultaneously and directly measure “passive” viscoelastic material properties and “active” contractile prestress of living cells at the nanoscale.

Mapping in vitro local material properties of intact and disrupted virions at high resolution using multi-harmonic atomic force microscopy

Nanoscale ◽  
2013 ◽  
Vol 5 (11) ◽  
pp. 4729 ◽  
Author(s):  
Alexander Cartagena ◽  
Mercedes Hernando-Pérez ◽  
José L. Carrascosa ◽  
Pedro J. de Pablo ◽  
Arvind Raman
Keyword(s):  
Atomic Force Microscopy ◽  
High Resolution ◽  
Material Properties ◽  
Force Microscopy ◽  
Atomic Force ◽  
Local Material ◽  
Local Material Properties
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