Corrigendum to “Morphology, photoluminescence and electronic structure in oxidized silicon nanoclusters” [J. Electron Spectrosc. Relat. Phenom. 114–116 (2001) 229–234]

2005 ◽  
Vol 142 (2) ◽  
pp. 173 ◽  
Author(s):  
J.A. Carlisle ◽  
I.N. Germanenko ◽  
Y.B. Pithawalla ◽  
M.S. El-Shall
Keyword(s):  
Electronic Structure ◽  
Silicon Nanoclusters

Electronic structure and chemical environment of silicon nanoclusters embedded in a silicon dioxide matrix

2006 ◽  
Vol 88 (16) ◽  
pp. 163103 ◽  
Author(s):  
Anna Zimina ◽  
Stefan Eisebitt ◽  
Wolfgang Eberhardt ◽  
Johannes Heitmann ◽  
Margit Zacharias
Keyword(s):  
Electronic Structure ◽  
Silicon Dioxide ◽  
Chemical Environment ◽  
Silicon Nanoclusters ◽  
Silicon Dioxide Matrix

The Effects of Deposition and Processing Parameters on the Electronic Structure and Photoluminescence from Nitride-Passivated Silicon Nanoclusters

2019 ◽  
Vol 16 (21) ◽  
pp. 33-41 ◽  
Author(s):  
Patrick R. Wilson ◽  
Tyler Roschuk ◽  
Othman Zalloum ◽  
Jacek Wojcik ◽  
P. Mascher
Keyword(s):  
Electronic Structure ◽  
Processing Parameters ◽  
Silicon Nanoclusters ◽  
Passivated Silicon

Atomic and Electronic Structure of New Hollow-Based Symmetric Families of Silicon Nanoclusters

2007 ◽  
Vol 111 (51) ◽  
pp. 18824-18830 ◽  
Author(s):  
Pavel V. Avramov ◽  
Dmitri G. Fedorov ◽  
Pavel B. Sorokin ◽  
Leonid A. Chernozatonskii ◽  
Mark S. Gordon
Keyword(s):  
Electronic Structure ◽  
Silicon Nanoclusters ◽  
Atomic And Electronic Structure

MORPHOLOGY AND ELECTRONIC STRUCTURE OF OXIDIZED SILICON NANOCLUSTERS

2000 ◽  
Author(s):  
J. A. CARLISLE ◽  
I. N. GERMANENKO ◽  
Y. PITHAWALLA ◽  
M. DONGOL ◽  
M. S. EL-SHALL
Keyword(s):  
Electronic Structure ◽  
Silicon Nanoclusters

scholarly journals Soft X-Ray Emission Studies of the Electronic Structure in Silicon Nanoclusters

1996 ◽  
Vol 452 ◽  
Author(s):  
T. Van Buuren ◽  
L. N. Dinh ◽  
L. L. Chase ◽  
W. J. Siekhaus ◽  
I. Jimenez ◽  
...  
Keyword(s):  
Electronic Structure ◽  
Cluster Size ◽  
Lower Energy ◽  
Progressive Increase ◽  
Valence Band Edge ◽  
Silicon Nanoclusters ◽  
Absorption Data ◽  
X Ray ◽  
X Ray Absorption ◽  
Emission Studies

AbstractDensity of states changes in the valence and conduction band of silicon nanoclusters were monitored using soft x-ray emission and absorption spectroscopy as a function of cluster size. A progressive increase in the valence band edge toward lower energy is found for clusters with decreasing diameters. A similar but smaller shift is observed in the near-edge x-ray absorption data of the silicon nanoclusters.

Multiscale simulation of the electronic structure of silicon nanoclusters

2013 ◽  
Vol 40 (5) ◽  
pp. 132-135
Author(s):  
Yu. A. Uspenskii ◽  
O. V. Ivanov ◽  
E. T. Kulatov ◽  
A. N. Rubtsov ◽  
N. L. Matsko ◽  
...  
Keyword(s):  
Electronic Structure ◽  
Multiscale Simulation ◽  
Silicon Nanoclusters

Electronic Structure of Amorphous Silicon Nanoclusters

1997 ◽  
Vol 78 (16) ◽  
pp. 3161-3164 ◽  
Author(s):  
G. Allan ◽  
C. Delerue ◽  
M. Lannoo
Keyword(s):  
Electronic Structure ◽  
Amorphous Silicon ◽  
Silicon Nanoclusters
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