scholarly journals Soft X-Ray Emission Studies of the Electronic Structure in Silicon Nanoclusters

1996 ◽  
Vol 452 ◽  
Author(s):  
T. Van Buuren ◽  
L. N. Dinh ◽  
L. L. Chase ◽  
W. J. Siekhaus ◽  
I. Jimenez ◽  
...  
Keyword(s):  
Electronic Structure ◽  
Cluster Size ◽  
Lower Energy ◽  
Progressive Increase ◽  
Valence Band Edge ◽  
Silicon Nanoclusters ◽  
Absorption Data ◽  
X Ray ◽  
X Ray Absorption ◽  
Emission Studies

AbstractDensity of states changes in the valence and conduction band of silicon nanoclusters were monitored using soft x-ray emission and absorption spectroscopy as a function of cluster size. A progressive increase in the valence band edge toward lower energy is found for clusters with decreasing diameters. A similar but smaller shift is observed in the near-edge x-ray absorption data of the silicon nanoclusters.

Manganese K- and L3-Edge X-Ray Absorption Fine Structure Study of Zn1-xMnxTe

2013 ◽  
Vol 634-638 ◽  
pp. 2489-2492 ◽  
Author(s):  
Wei Zheng ◽  
Ling Yun Jang ◽  
Jenn Min Lee ◽  
Rui Sheng Zheng ◽  
Chee Wee Liu ◽  
...  
Keyword(s):  
Electronic Structure ◽  
Fine Structure ◽  
Structure Study ◽  
Chemical Bonds ◽  
Bulk Materials ◽  
Absorption Data ◽  
Edge Structure ◽  
X Ray ◽  
Absorption Fine ◽  
X Ray Absorption

High-resolution synchrotron radiation x-ray absorption data on Mn K- and L3-edge for semimagnetic semiconductor Zn1-xMnxTe bulk materials are presented. A detailed analysis of the extended x-ray absorption fine structure by using the IFEFFIT program, and the chemical bonds of Mn-Te are obtained. The x-ray absorption near-edge structure of the Mn K- and L3-edges are investigated, and the electronic structure of Zn1-xMnxTe with various compositions are studied.

SIGMAL: A Program for Calculating L-Shell lonization Cross-Sections

1981 ◽  
Vol 39 ◽  
pp. 198-199 ◽  
Author(s):  
R.F. Egerton
Keyword(s):  
Cross Sections ◽  
Fortran Program ◽  
Absorption Data ◽  
X Ray ◽  
Atomic Electrons ◽  
Energy Dependent ◽  
Hydrogenic Model ◽  
Electron Energy Loss ◽  
X Ray Absorption ◽  
Shell Ionization

SIGMAL is a short (∼ 100-line) Fortran program designed to rapidly compute cross-sections for L-shell ionization, particularly the partial crosssections required in quantitative electron energy-loss microanalysis. The program is based on a hydrogenic model, the L1 and L23 subshells being represented by scaled Coulombic wave functions, which allows the generalized oscillator strength (GOS) to be expressed analytically. In this basic form, the model predicts too large a cross-section at energies near to the ionization edge (see Fig. 1), due mainly to the fact that the screening effect of the atomic electrons is assumed constant over the L-shell region. This can be remedied by applying an energy-dependent correction to the GOS or to the effective nuclear charge, resulting in much closer agreement with experimental X-ray absorption data and with more sophisticated calculations (see Fig. 1 ).

Electronic Structure and X-ray Absorption Spectra of Rutile TiO2 Using First-Principles Calculations

2014 ◽  
Vol 52 (12) ◽  
pp. 1025-1029
Author(s):  
Min-Wook Oh ◽  
Tae-Gu Kang ◽  
Byungki Ryu ◽  
Ji Eun Lee ◽  
Sung-Jae Joo ◽  
...  
Keyword(s):  
Electronic Structure ◽  
Absorption Spectra ◽  
First Principles ◽  
First Principles Calculations ◽  
Rutile Tio2 ◽  
X Ray ◽  
X Ray Absorption

Electronic structure of TiO2 nanotube arrays from X-ray absorption near edge structure studies

2009 ◽  
Vol 19 (37) ◽  
pp. 6804 ◽  
Author(s):  
J. G. Zhou ◽  
H. T. Fang ◽  
J. M. Maley ◽  
M. W. Murphy ◽  
J. Y. Peter Ko ◽  
...  
Keyword(s):  
Electronic Structure ◽  
Tio2 Nanotube Arrays ◽  
Tio2 Nanotube ◽  
Nanotube Arrays ◽  
Edge Structure ◽  
X Ray ◽  
X Ray Absorption

Electronic structure ofMS(M=Ca,Mg,Fe,Mn): X-ray absorption analysis

2004 ◽  
Vol 69 (13) ◽  
Author(s):  
A. N. Kravtsova ◽  
I. E. Stekhin ◽  
A. V. Soldatov ◽  
X. Liu ◽  
M. E. Fleet
Keyword(s):  
Electronic Structure ◽  
Absorption Analysis ◽  
X Ray ◽  
X Ray Absorption

Local electronic structure analysis of Zn-doped BiFeO3 powders by X-ray absorption fine structure spectroscopy

2017 ◽  
Vol 710 ◽  
pp. 843-849 ◽  
Author(s):  
Turghunjan Gholam ◽  
Abduleziz Ablat ◽  
Mamatrishat Mamat ◽  
Rong Wu ◽  
Aimierding Aimidula ◽  
...  
Keyword(s):  
Electronic Structure ◽  
Fine Structure ◽  
Structure Analysis ◽  
X Ray ◽  
Absorption Fine ◽  
Local Electronic Structure ◽  
X Ray Absorption
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