Optical characterization of randomly microrough surfaces covered with very thin overlayers using effective medium approximation and Rayleigh–Rice theory

2017 ◽  
Vol 419 ◽  
pp. 942-956 ◽  
Author(s):  
Ivan Ohlídal ◽  
Jiří Vohánka ◽  
Martin Čermák ◽  
Daniel Franta
Keyword(s):  
Optical Characterization ◽  
Effective Medium ◽  
Effective Medium Approximation

Infrared-Optical Characterization of Metallic Island Films

1997 ◽  
Vol 51 (6) ◽  
pp. 902-904 ◽  
Author(s):  
Arnulf Röseler ◽  
Ernst-Heiner Korte
Keyword(s):  
Infrared Spectra ◽  
Infrared Absorption ◽  
Optical Constants ◽  
Optical Characterization ◽  
Effective Medium ◽  
Island Film ◽  
Surface Enhanced ◽  
Effective Medium Approach ◽  
Island Films

The ellipsometric infrared spectra of a metallic island film indicate its potential for surface-enhanced infrared absorption (SEIRA). Such a film is characterized by unique optical constants, and these can be simulated by using an effective-medium approach.

Optical Characterization of Chemically Vapor Deposited and Laser-Annealed Polysilicon

1981 ◽  
Vol 4 ◽  
Author(s):  
B. G. Bagley ◽  
D. E. Aspnes ◽  
G. K. Celler ◽  
A. C. Adams
Keyword(s):  
Optical Properties ◽  
Spectroscopic Ellipsometry ◽  
Silicon Surface ◽  
Optical Characterization ◽  
Effective Medium Approximation ◽  
Incident Power ◽  
Spot Diameter ◽  
Amorphous Component ◽  
Ion Laser

ABSTRACTThe optical properties of polysilicon on insulating SiO2 were measured by spectroscopic ellipsometry over the energy range 3.0 to 6.0 eV. Spectra were obtained for films as-deposited and after irradiation with an Ar ion laser (focused to a 50μm spot diameter) at 6.0, 7.0 or 7.5 watts. We observed monotonic changes in both ε1 and ε2 with increasing incident power even though the power density was high enough to completely melt the silicon surface in all cases. The changes observed are caused by changes in microstructure; with increasing power the amorphous component decreases and the density increases. Approximate values of the microstructural components are estimated by comparing measured spectra to those synthesized from constituent spectra in the Bruggeman effective medium approximation.

Effective Medium Approximation for Composite from Three-layered Spherical Particles

PIERS Online ◽  
2009 ◽  
Vol 5 (4) ◽  
pp. 365-368 ◽  
Author(s):  
D. M. Dolgushin ◽  
Anton P. Anzulevich ◽  
V. D. Buchelnikov ◽  
I. V. Bychkov ◽  
Dmitri V. Louzguine-Luzgin
Keyword(s):  
Effective Medium ◽  
Spherical Particles ◽  
Effective Medium Approximation

Crystal Growth and Electro-optical Characterization of In2Se2.7Sb0.3 Compound

2020 ◽  
Vol 12 (4) ◽  
pp. 04022-1-04022-4
Author(s):  
Piyush Patel ◽  
◽  
S. M. Vyas ◽  
Vimal Patel ◽  
Himanshu Pavagadhi ◽  
...  
Keyword(s):  
Crystal Growth ◽  
Optical Characterization

Optical Characterization of Monodispersed Aaqueous Cu2+-Doped CdS Nanoparticles Prepared Under Microwave Irradiation Conditions

2014 ◽  
Vol 01 (999) ◽  
pp. 1-1
Author(s):  
Wei Zhu ◽  
Qihui Shen ◽  
Xinjian Bao ◽  
Xiao Bai ◽  
Tingting Li ◽  
...  
Keyword(s):  
Microwave Irradiation ◽  
Optical Characterization ◽  
Cds Nanoparticles

Application of Kubelka-Munk model on the optical characterization of translucent dental zirconia

2021 ◽  
Vol 258 ◽  
pp. 123994
Author(s):  
Luciana M. Schabbach ◽  
Bruno C. dos Santos ◽  
Letícia S. De Bortoli ◽  
Márcio Celso Fredel ◽  
Bruno Henriques
Keyword(s):  
Optical Characterization

scholarly journals Magneto-optical characterization of ZnO / Ni nano-laminate obtained via Atomic Layer Deposition

2021 ◽  
Vol 1762 (1) ◽  
pp. 012041
Author(s):  
K Buchkov ◽  
A Galluzzi ◽  
B Blagoev ◽  
A Paskaleva ◽  
P Terziyska ◽  
...  
Keyword(s):  
Atomic Layer Deposition ◽  
Atomic Layer ◽  
Optical Characterization ◽  
Layer Deposition
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