Critical invisible defect detection system of thin film transistor panels using Kelvin probe force microscopy

2016 ◽  
Vol 375 ◽  
pp. 19-25 ◽  
Author(s):  
Yonmook Park ◽  
Keun Heo
Keyword(s):  
Thin Film ◽  
Defect Detection ◽  
Detection System ◽  
Thin Film Transistor ◽  
Kelvin Probe Force Microscopy ◽  
Kelvin Probe ◽  
Force Microscopy

The density of states in thin film copper phthalocyanine measured by Kelvin probe force microscopy

2008 ◽  
Vol 93 (8) ◽  
pp. 083308 ◽  
Author(s):  
K. Celebi ◽  
P. J. Jadhav ◽  
K. M. Milaninia ◽  
M. Bora ◽  
M. A. Baldo
Keyword(s):  
Thin Film ◽  
Density Of States ◽  
Copper Phthalocyanine ◽  
Kelvin Probe Force Microscopy ◽  
Kelvin Probe ◽  
Force Microscopy

Investigation on organic thin film transistors (TFT) by Kelvin probe force microscopy (KPFM)

2020 ◽  
Author(s):  
Mélanie Brouillard ◽  
Ute Zschieschang ◽  
Nicolas Bogdan Bercu ◽  
Olivier Simonetti ◽  
Hagen Klauk ◽  
...  
Keyword(s):  
Thin Film ◽  
Thin Film Transistors ◽  
Organic Thin Film Transistors ◽  
Kelvin Probe Force Microscopy ◽  
Organic Thin Film ◽  
Kelvin Probe ◽  
Force Microscopy

Analysis of untreated cross sections of Cu(In,Ga)Se2 thin-film solar cells with varying Ga content using Kelvin probe force microscopy

2011 ◽  
Vol 99 (4) ◽  
pp. 042111 ◽  
Author(s):  
Zhenhao Zhang ◽  
Xiaochen Tang ◽  
Uli Lemmer ◽  
Wolfram Witte ◽  
Oliver Kiowski ◽  
...  
Keyword(s):  
Thin Film ◽  
Solar Cells ◽  
Cross Sections ◽  
Kelvin Probe Force Microscopy ◽  
Thin Film Solar Cells ◽  
Kelvin Probe ◽  
Force Microscopy ◽  
Ga Content
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