Surface potential measurement on contact resistance of amorphous-InGaZnO thin film transistors by Kelvin probe force microscopy

2016 ◽  
Vol 109 (2) ◽  
pp. 023509 ◽  
Author(s):  
Zhiheng Han ◽  
Guangwei Xu ◽  
Wei Wang ◽  
Congyan Lu ◽  
Nianduan Lu ◽  
...  
Keyword(s):  
Thin Film ◽  
Contact Resistance ◽  
Surface Potential ◽  
Thin Film Transistors ◽  
Kelvin Probe Force Microscopy ◽  
Kelvin Probe ◽  
Potential Measurement ◽  
Force Microscopy ◽  
Amorphous Ingazno

Surface Potential Measurement of Oligothiophene Ultrathin Films by Kelvin Probe Force Microscopy

2001 ◽  
Vol 40 (Part 1, No. 6B) ◽  
pp. 4381-4383 ◽  
Author(s):  
Keiichi Umeda ◽  
Kei Kobayashi ◽  
Kenji Ishida ◽  
Shu Hotta ◽  
Hirofumi Yamada ◽  
...  
Keyword(s):  
Surface Potential ◽  
Ultrathin Films ◽  
Kelvin Probe Force Microscopy ◽  
Kelvin Probe ◽  
Potential Measurement ◽  
Force Microscopy

Investigation on organic thin film transistors (TFT) by Kelvin probe force microscopy (KPFM)

2020 ◽  
Author(s):  
Mélanie Brouillard ◽  
Ute Zschieschang ◽  
Nicolas Bogdan Bercu ◽  
Olivier Simonetti ◽  
Hagen Klauk ◽  
...  
Keyword(s):  
Thin Film ◽  
Thin Film Transistors ◽  
Organic Thin Film Transistors ◽  
Kelvin Probe Force Microscopy ◽  
Organic Thin Film ◽  
Kelvin Probe ◽  
Force Microscopy
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