Characterization of HfO2/Si(0 0 1) interface with high-resolution Rutherford backscattering spectroscopy

K. Nakajima; S. Joumori; M. Suzuki; K. Kimura; T. Osipowicz; K.L. Tok; J.Z. Zheng; A. See; B.C. Zhang

doi:10.1016/j.apsusc.2004.06.087

Characterization of HfO2/Si(0 0 1) interface with high-resolution Rutherford backscattering spectroscopy

Applied Surface Science ◽

10.1016/j.apsusc.2004.06.087 ◽

2004 ◽

Vol 237 (1-4) ◽

pp. 416-420 ◽

Cited By ~ 8

Author(s):

K. Nakajima ◽

S. Joumori ◽

M. Suzuki ◽

K. Kimura ◽

T. Osipowicz ◽

...

Keyword(s):

High Resolution ◽

Rutherford Backscattering ◽

Rutherford Backscattering Spectroscopy

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Surface characterization of imidazolium ionic liquids by high-resolution Rutherford backscattering spectroscopy and X-ray photoelectron spectroscopy

Surface Science ◽

10.1016/j.susc.2009.12.023 ◽

2010 ◽

Vol 604 (3-4) ◽

pp. 464-469 ◽

Cited By ~ 49

Author(s):

Hiroki Hashimoto ◽

Atsushi Ohno ◽

Kaoru Nakajima ◽

Motofumi Suzuki ◽

Hiroshi Tsuji ◽

...

Keyword(s):

Ionic Liquids ◽

High Resolution ◽

Photoelectron Spectroscopy ◽

Surface Characterization ◽

Rutherford Backscattering ◽

Rutherford Backscattering Spectroscopy ◽

Imidazolium Ionic Liquids ◽

X Ray

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Tungsten surface enrichment in EUROFER and Fe-W model systems studied by high-resolution time-of-flight rutherford backscattering spectroscopy

Nuclear Materials and Energy ◽

10.1016/j.nme.2018.10.004 ◽

2018 ◽

Vol 17 ◽

pp. 147-151 ◽

Cited By ~ 3

Author(s):

M. Mayer ◽

T.F. Silva ◽

R. Arredondo ◽

M. Balden ◽

I. Bogdanović-Radović ◽

...

Keyword(s):

High Resolution ◽

Time Of Flight ◽

Rutherford Backscattering ◽

Rutherford Backscattering Spectroscopy ◽

Model Systems ◽

Surface Enrichment ◽

Resolution Time ◽

Tungsten Surface

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Surface structures of equimolar mixtures of imidazolium-based ionic liquids using high-resolution Rutherford backscattering spectroscopy

Surface Science ◽

10.1016/j.susc.2012.07.013 ◽

2012 ◽

Vol 606 (21-22) ◽

pp. 1693-1699 ◽

Cited By ~ 25

Author(s):

Kaoru Nakajima ◽

Shinichi Oshima ◽

Motofumi Suzuki ◽

Kenji Kimura

Keyword(s):

Ionic Liquids ◽

High Resolution ◽

Rutherford Backscattering ◽

Rutherford Backscattering Spectroscopy ◽

Surface Structures

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Surface structure of an ionic liquid with high-resolution Rutherford backscattering spectroscopy

Nuclear Instruments and Methods in Physics Research Section B Beam Interactions with Materials and Atoms ◽

10.1016/j.nimb.2008.11.020 ◽

2009 ◽

Vol 267 (4) ◽

pp. 605-609 ◽

Cited By ~ 22

Author(s):

K. Nakajima ◽

A. Ohno ◽

M. Suzuki ◽

K. Kimura

Keyword(s):

Ionic Liquid ◽

High Resolution ◽

Surface Structure ◽

Rutherford Backscattering ◽

Rutherford Backscattering Spectroscopy

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High Resolution X-Ray Diffraction and Rutherford Backscattering Spectroscopy Studies on Laser Molecular Beam Epitaxy Grown GaN Layers on Sapphire (0001)

Advanced Science Letters ◽

10.1166/asl.2014.5540 ◽

2014 ◽

Vol 20 (7) ◽

pp. 1406-1409 ◽

Cited By ~ 3

Author(s):

M. Senthil Kumar ◽

S. S. Kushvaha ◽

K. K. Maurya ◽

K. Saravanan ◽

Sunil Ojha

Keyword(s):

High Resolution ◽

Molecular Beam Epitaxy ◽

Molecular Beam ◽

Rutherford Backscattering ◽

Rutherford Backscattering Spectroscopy ◽

X Ray Diffraction ◽

X Ray ◽

Laser Molecular Beam Epitaxy ◽

Spectroscopy Studies

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Characterization of Ruthenium Thin Film on Tantalum by Electrochemical Deposition: Rutherford Backscattering Spectroscopy

Science of Advanced Materials ◽

10.1166/sam.2011.1220 ◽

2011 ◽

Vol 3 (6) ◽

pp. 932-938 ◽

Cited By ~ 2

Author(s):

Minwu Song ◽

Sadia Ameen ◽

Dong-Gyu Kim ◽

Hyung-Shik Shin ◽

S. G. Ansari ◽

...

Keyword(s):

Thin Film ◽

Electrochemical Deposition ◽

Rutherford Backscattering ◽

Rutherford Backscattering Spectroscopy

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Lattice Distortion at SiO2/Si(001) Interface Studied with High-Resolution Rutherford Backscattering Spectroscopy/Channeling

Japanese Journal of Applied Physics ◽

10.1143/jjap.45.2467 ◽

2006 ◽

Vol 45 (4A) ◽

pp. 2467-2469 ◽

Cited By ~ 7

Author(s):

Kaoru Nakajima ◽

Motofumi Suzuki ◽

Kenji Kimura ◽

Masashi Yamamoto ◽

Akinobu Teramoto ◽

...

Keyword(s):

High Resolution ◽

Lattice Distortion ◽

Rutherford Backscattering ◽

Rutherford Backscattering Spectroscopy

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High-resolution Rutherford backscattering spectroscopy for Nano-CMOS applications

2006 International Workshop on Nano CMOS ◽

10.1109/iwnc.2006.4570980 ◽

2006 ◽

Cited By ~ 2

Author(s):

Kenji Kimura ◽

Zhao Ming ◽

Kaoru Nakajima ◽

Motofumi Suzuki

Keyword(s):

High Resolution ◽

Rutherford Backscattering ◽

Rutherford Backscattering Spectroscopy

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Characterization of defects in self‐ion implanted Si using positron annihilation spectroscopy and Rutherford backscattering spectroscopy

Journal of Applied Physics ◽

10.1063/1.362634 ◽

1996 ◽

Vol 79 (12) ◽

pp. 9017-9021 ◽

Cited By ~ 28

Author(s):

M. Fujinami ◽

A. Tsuge ◽

K. Tanaka

Keyword(s):

Positron Annihilation ◽

Positron Annihilation Spectroscopy ◽

Rutherford Backscattering ◽

Rutherford Backscattering Spectroscopy ◽

Ion Implanted

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Improvement of Sensitivity in High-resolution Rutherford Backscattering Spectroscopy

Journal of the Vacuum Society of Japan ◽

10.3131/jvsj2.56.355 ◽

2013 ◽

Vol 56 (9) ◽

pp. 355-359

Author(s):

Kaoru NAKAJIMA ◽

Hiroki HASHIMOTO ◽

Kenji KIMURA

Keyword(s):

High Resolution ◽

Rutherford Backscattering ◽

Rutherford Backscattering Spectroscopy

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