Lattice Distortion at SiO2/Si(001) Interface Studied with High-Resolution Rutherford Backscattering Spectroscopy/Channeling
2006 ◽
Vol 45
(4A)
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pp. 2467-2469
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2018 ◽
Vol 17
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pp. 147-151
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Vol 606
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pp. 1693-1699
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2010 ◽
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pp. 044702
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