Ar dilution effects on hydrogen concentration and mass density obtained by X-ray and neutron reflectivity on hydrogenated amorphous nitride thin films

2002 ◽  
Vol 74 (0) ◽  
pp. s1104-s1106 ◽  
Author(s):  
S. Santucci ◽  
L. Valentini ◽  
A. Menelle ◽  
L. Lozzi ◽  
R. Coppola ◽  
...  
Keyword(s):  
Thin Films ◽  
Hydrogen Concentration ◽  
Mass Density ◽  
Neutron Reflectivity ◽  
X Ray ◽  
Dilution Effects ◽  
Hydrogenated Amorphous

scholarly journals Hydrogen concentration and mass density of diamondlike carbon films obtained by x‐ray and neutron reflectivity

1994 ◽  
Vol 76 (8) ◽  
pp. 4636-4642 ◽  
Author(s):  
E. Findeisen ◽  
R. Feidenhans’l ◽  
M. E. Vigild ◽  
K. N. Clausen ◽  
J. Bindslev Hansen ◽  
...  
Keyword(s):  
Hydrogen Concentration ◽  
Mass Density ◽  
Carbon Films ◽  
Neutron Reflectivity ◽  
X Ray ◽  
Diamondlike Carbon

Structural characterization of sputter-deposited LaNiO3 thin films on Si substrate by x-ray reflectivity and diffraction

1997 ◽  
Vol 12 (11) ◽  
pp. 3165-3173 ◽  
Author(s):  
Hsin-Yi Lee ◽  
Tai-Bor Wu
Keyword(s):  
Thin Films ◽  
Transition Layer ◽  
Mass Density ◽  
Composition Analysis ◽  
X Ray Diffraction ◽  
Diffraction Intensity ◽  
Si Substrate ◽  
X Ray ◽  
Sputter Deposited ◽  
Reflectivity Data

X-ray reflectivity and diffraction were applied to characterize the highly (100)-textured thin films of LaNiO3, which were deposited on Si substrate via radio frequency magnetron sputtering at temperatures ranging from 250 to 450 °C. Two interference fringes of different period were observed from the reflectivity curves, and the fitting result indicates that in addition to the normal lanthanum-nickel oxide layer, a transition layer, which has a larger mass density than the previous one, exists in the sputter-deposited films. A comparison of the measured x-ray diffraction intensity with that calculated from layer thickness and mass density obtained from reflectivity data indicates that the transition layer is noncrystalline. The x-ray diffraction result also shows that there is a significant decrease of (100) diffraction intensity relative to that of (200) as increasing the deposition temperature. Using the reflectivity and diffraction data along with results of electron diffraction and film composition analysis from our other studies, such a change of relative intensity between the two diffraction peaks is attributed to the increasing content of two also highly textured La-rich phases, i.e., (110)-textured La4Ni3O10 and (100)-textured La2NiO4, in addition to the LaNiO3.

Mass density of polystyrene thin films measured by twin neutron reflectivity

1998 ◽  
Vol 108 (9) ◽  
pp. 3798-3804 ◽  
Author(s):  
W. E. Wallace ◽  
N. C. Beck Tan ◽  
W. L. Wu ◽  
S. Satija
Keyword(s):  
Thin Films ◽  
Mass Density ◽  
Neutron Reflectivity
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