Point-defect interaction in a dislocation core

2000 ◽  
Vol 43 (4) ◽  
pp. 320-327 ◽  
Author(s):  
I. T. Suprun
PAMM ◽  
2008 ◽  
Vol 8 (1) ◽  
pp. 10499-10500
Author(s):  
Oliver Goy ◽  
Ralf Mueller

1999 ◽  
Vol 568 ◽  
Author(s):  
H. Puchner ◽  
S. Aronowitz

ABSTRACTThe global scaling down of device dimensions requires process technologies which are able to create ultra-shallow junctions. Besides using ultra-low implant energies for shallow junction creation we present an alternative approach for the creation of MDD (Medium Doped Drain) junctions by using moderately low implant energies. Our approach employs the dopant/point-defect interaction mechanism to retard dopant diffusion as well as dopant de-activation in the tail of the diffusion profiles to achieve suitable shallow junctions. The silicon preimplant allows fabrication of 90nm arsenic, 150nm phosphorus, and 140nm boron metallurgical junctions for a 40keV arsenic, 20keV phosphorus, and 8keV boron implant.


1985 ◽  
Vol 59 ◽  
Author(s):  
A. Ourmazd

ABSTRACTDespite the apparent dissimilarities between different gettering methods, we show that many can be understood in terms of two basic mechanisms. The first involves the interaction of selfinterstitials (emitted, for example, by P in-diffusion and precipitation, 0 precipitation, or Ar implantation) with the impurities to be gettered. The second relies on a strain-field/point defect interaction (for example around a dislocation), which appears capable of enhancing the diffusivity of the impurities. In either case, gettering can be viewed as a particular and particularly useful instance of the wider class of defect/defect interactions.


1989 ◽  
Vol 6-7 ◽  
pp. 289-300
Author(s):  
B.Ya. Farber ◽  
H.G. Minasyan ◽  
V.I. Nikitenko

Sign in / Sign up

Export Citation Format

Share Document