Simulation of the hot-carrier degradation in short channel transistors with high-K dielectric

2010 ◽  
Vol 23 (4-5) ◽  
pp. 315-323 ◽  
Author(s):  
E. Amat ◽  
T. Kauerauf ◽  
R. Degraeve ◽  
R. Rodríguez ◽  
M. Nafría ◽  
...  
Keyword(s):  
Short Channel ◽  
Hot Carrier ◽  
High K ◽  
High K Dielectric ◽  
Hot Carrier Degradation

Channel hot-carrier degradation in pMOS and nMOS short channel transistors with high-k dielectric stack

2010 ◽  
Vol 87 (1) ◽  
pp. 47-50 ◽  
Author(s):  
E. Amat ◽  
T. Kauerauf ◽  
R. Degraeve ◽  
R. Rodríguez ◽  
M. Nafría ◽  
...  
Keyword(s):  
Short Channel ◽  
Hot Carrier ◽  
High K ◽  
High K Dielectric ◽  
Hot Carrier Degradation

Channel hot-carrier degradation under AC stress in short channel nMOS devices with high-k gate stacks

2009 ◽  
Vol 86 (7-9) ◽  
pp. 1908-1910 ◽  
Author(s):  
E. Amat ◽  
R. Rodríguez ◽  
M. Nafría ◽  
X. Aymerich
Keyword(s):  
Gate Stacks ◽  
Short Channel ◽  
Hot Carrier ◽  
High K ◽  
Hot Carrier Degradation

Channel Hot-Carrier Degradation in Short-Channel Transistors With High- $k$/Metal Gate Stacks

2009 ◽  
Vol 9 (3) ◽  
pp. 425-430 ◽  
Author(s):  
E. Amat ◽  
T. Kauerauf ◽  
R. Degraeve ◽  
A. De Keersgieter ◽  
R. Rodriguez ◽  
...  
Keyword(s):  
Gate Stacks ◽  
Metal Gate ◽  
Short Channel ◽  
Hot Carrier ◽  
High K ◽  
Hot Carrier Degradation

A comprehensive study of channel hot-carrier degradation in short channel MOSFETs with high-k dielectrics

2013 ◽  
Vol 103 ◽  
pp. 144-149 ◽  
Author(s):  
E. Amat ◽  
T. Kauerauf ◽  
R. Rodriguez ◽  
M. Nafria ◽  
X. Aymerich ◽  
...  
Keyword(s):  
Short Channel ◽  
Hot Carrier ◽  
High K ◽  
Comprehensive Study ◽  
Hot Carrier Degradation

Comparison of DC/AC Hot Carrier Degradation between Short Channel Si Bulk and SiGe SOI p-FinFETs

2021 ◽  
Author(s):  
Hao Chang ◽  
Yongkui Zhang ◽  
Longda Zhou ◽  
Zhigang Ji ◽  
Hong Yang ◽  
...  
Keyword(s):  
Short Channel ◽  
Hot Carrier ◽  
Hot Carrier Degradation
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