Determination of electron-diffusion length from photocurrent characteristics of the structure ITO/a-SiC:H(p-type)/a-Si:H/a-Si:H(n-type)/Pd
1994 ◽
Vol 59
(4)
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pp. 431-433
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Keyword(s):
Keyword(s):
2009 ◽
Vol 113
(11)
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pp. 4726-4731
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1990 ◽
Vol 8
(5)
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pp. 3676-3681
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Keyword(s):
Keyword(s):
1984 ◽
Vol 19
(2)
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pp. 285-290
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Keyword(s):
2011 ◽
Vol 115
(28)
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pp. 13932-13937
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