2015 ◽  
Vol 62 ◽  
pp. 447-459
Author(s):  
Bruce A. Joyce

Ronald Charles (Ron) Newman was one of the most versatile semiconductor physicists of his generation and is distinguished for his work in several different areas, most notably epitaxial growth and the behaviour of impurities and dopants in a range of device-related materials, mainly silicon and gallium arsenide. His most significant contributions came from the application of local vibrational-mode spectroscopy to studies of the segregation and diffusion of oxygen and hydrogen in silicon. The results were of fundamental importance in the fabrication of integrated circuits.


1989 ◽  
Vol 54 (15) ◽  
pp. 1442-1444 ◽  
Author(s):  
J. Schneider ◽  
B. Dischler ◽  
H. Seelewind ◽  
P. M. Mooney ◽  
J. Lagowski ◽  
...  

1992 ◽  
Vol 291 ◽  
Author(s):  
D. N. Talwar ◽  
D. W. Fischer ◽  
M. O. Manasreh ◽  
G. Matous

ABSTRACTBy using a Van de Graaff accelerator we have implanted 2 MeV protons and deuterons into InP samples. These implanted samples were annealed in 50 °C increments in the 200 to 600 °C temperature range for 30 minutes each and then measured by the infrared absorption spectroscopy. A group of four different local vibrational mode absorption lines is observed, each of which arises from the hydrogen-phosphorus stretching vibration with different defects or impurities at nearest-neighbor sites. Each mode exhibits an annealing behavior which is different than any of the other absorption lines. The annealing results are shown and discussed in terms of Green's function calculations of the defects responsible for the two absorption lines.


1985 ◽  
Vol 46 ◽  
Author(s):  
R. C. Newman

AbstractInfrared band—mode and LVM absorption is illustrated for a range of impurities and impurity—complexes in silicon and gallium arsenide. We discuss the effects of changes in the local force constants and contributions to the dipole moment resulting from displacements of host lattice atoms. The difficulties in establishing absolute calibrations relating the strength of the absorption to the concentration of defects are highlighted. Our purpose is to show how the measurements lead to characterization of crystals and how they complement other diagnostic techniques to evaluate effects of irradiation, heat treatments, diffusions etc.


2009 ◽  
Vol 404 (23-24) ◽  
pp. 4568-4571
Author(s):  
L.I. Murin ◽  
B.G. Svensson ◽  
J.L. Lindström ◽  
V.P. Markevich ◽  
C.A. Londos

1991 ◽  
Vol 69 (2) ◽  
pp. 971-974 ◽  
Author(s):  
J. Wagner ◽  
M. Maier ◽  
R. Murray ◽  
R. C. Newman ◽  
R. B. Beall ◽  
...  

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