Theory of valence and conduction band offsets in Si/Si 1−yCy heterostructures

2002 ◽  
Vol 31 (5) ◽  
pp. 253-256 ◽  
Author(s):  
A.J. Ekpunobi ◽  
A.O.E. Animalu
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2004 ◽  
Vol 241 (10) ◽  
pp. 2246-2252 ◽  
Author(s):  
S. Sayan ◽  
R. A. Bartynski ◽  
X. Zhao ◽  
E. P. Gusev ◽  
D. Vanderbilt ◽  
...  

2020 ◽  
Vol 529 ◽  
pp. 147119 ◽  
Author(s):  
Xiaobing Cao ◽  
Guoshuai Zhang ◽  
Yifan Cai ◽  
Long Jiang ◽  
Yan Chen ◽  
...  

1999 ◽  
Vol 85 (2) ◽  
pp. 985-993 ◽  
Author(s):  
D. V. Singh ◽  
K. Rim ◽  
T. O. Mitchell ◽  
J. L. Hoyt ◽  
J. F. Gibbons

2014 ◽  
Vol 116 (11) ◽  
pp. 113703 ◽  
Author(s):  
Sean W. King ◽  
Justin Brockman ◽  
Marc French ◽  
Milt Jaehnig ◽  
Markus Kuhn ◽  
...  
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1996 ◽  
Vol 39 (2) ◽  
pp. 79-81 ◽  
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A.Y. Polyakov ◽  
N.B. Smirnov ◽  
A.V. Govorkov ◽  
A.A. Chelniy ◽  
A.G. Milnes ◽  
...  
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1997 ◽  
Vol 482 ◽  
Author(s):  
J. A. Majewski ◽  
M. Städele

AbstractWe present a first-principles study of heteroepitaxial interfaces between GaN and both cubic as well as wurtzite AlN substrates oriented along main cubic or hexagonal directions and of stacking fault interfaces between cubic and wurtzite GaN. Our calculations show that all studied heterostructures are of type I. Valence band offsets for GaN/AlN are nearly independent of the substrate orientation and of the order of 0.8 eV. The valence and conduction band offsets for a stacking fault interface are predicted to be 40 meV and 175 meV, respectively.


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