Determination of conduction band offsets in type-IIIn0.27Ga0.73Sb∕InxAl1−xAsySb1−yheterostructures grown by molecular beam epitaxy

2006 ◽  
Vol 74 (23) ◽  
Author(s):  
E. R. Glaser ◽  
R. Magno ◽  
B. V. Shanabrook ◽  
J. G. Tischler
Keyword(s):  
Molecular Beam Epitaxy ◽  
Conduction Band ◽  
Molecular Beam ◽  
Band Offsets

Real-time determination of the segregation strength of indium atoms in InGaAs layers grown by molecular-beam epitaxy

2002 ◽  
Vol 81 (15) ◽  
pp. 2863-2865 ◽  
Author(s):  
S. Martini ◽  
A. A. Quivy ◽  
E. C. F. da Silva ◽  
J. R. Leite
Keyword(s):  
Molecular Beam Epitaxy ◽  
Real Time ◽  
Molecular Beam ◽  
Time Determination

Effect of V/III Ratio on the Properties of GaN Layers Grown by Molecular Beam Epitaxy Using NH3

1998 ◽  
Vol 512 ◽  
Author(s):  
N. Grandjean ◽  
M. Leroux ◽  
J. Massies ◽  
M. Mesrine ◽  
P. Lorenzini
Keyword(s):  
Molecular Beam Epitaxy ◽  
Molecular Beam ◽  
Flux Ratio ◽  
Buffer Layers ◽  
Force Microscopy ◽  
Sapphire Substrates ◽  
Atomic Force ◽  
Piezoelectric Field ◽  
Secondary Ion

ABSTRACTAmmonia as nitrogen precursor has been used to grow III-V nitrides by molecular beam epitaxy (MBE) on c-plane sapphire substrates. The efficiency of NH3 has been evaluated allowing the determination of the actual V/III flux ratio used during the GaN growth. The effects of the V/III ratio variation on the GaN layer properties have been investigated by photoluminescence (PL), Hall measurements, atomic force microscopy (AFM), and secondary ion mass spectroscopy (SIMS). It is found that a high V/III ratio leads to the best material quality. Optimized GaN thick buffer layers have been used to grow GaN/AlGaN quantum well (QW) heterostructures. Their PL spectra exhibit well resolved emission peaks for QW thicknesses varying from 3 to 15 monolayers. From the variation of the QW energies as a function of well width, a piezoelectric field of 450 kV/cm is deduced.

Band offsets of La2O3 on (0001) GaN grown by reactive molecular-beam epitaxy

2013 ◽  
Vol 102 (16) ◽  
pp. 162903 ◽  
Author(s):  
Jon F. Ihlefeld ◽  
Michael Brumbach ◽  
Stanley Atcitty
Keyword(s):  
Molecular Beam Epitaxy ◽  
Molecular Beam ◽  
Band Offsets

Determination of the dispersion of the index of refraction and the elastic moduli for molecular-beam-epitaxy-grown Zn1−xBexSe alloys

2001 ◽  
Vol 79 (4) ◽  
pp. 473-475 ◽  
Author(s):  
F. C. Peiris ◽  
U. Bindley ◽  
J. K. Furdyna ◽  
Hyunjung Kim ◽  
A. K. Ramdas ◽  
...  
Keyword(s):  
Molecular Beam Epitaxy ◽  
Elastic Moduli ◽  
Molecular Beam ◽  
Index Of Refraction

scholarly journals Bandgap energy determination of InAsSb epilayers grown by molecular beam epitaxy on GaAs substrates

2019 ◽  
Vol 29 (4) ◽  
pp. 472-476 ◽  
Author(s):  
K. Murawski ◽  
E. Gomółka ◽  
M. Kopytko ◽  
K. Grodecki ◽  
K. Michalczewski ◽  
...  
Keyword(s):  
Molecular Beam Epitaxy ◽  
Molecular Beam ◽  
Bandgap Energy ◽  
Gaas Substrates ◽  
Energy Determination
Sign in / Sign up

Export Citation Format

Share Document