Round-robin layer-thickness determination: Toward reliable reference-free X-ray spectrometry

2018 ◽  
Vol 48 (1) ◽  
pp. 3-7 ◽  
Author(s):  
Kenji Sakurai ◽  
Akira Kurokawa
Keyword(s):  
Layer Thickness ◽  
Round Robin ◽  
X Ray ◽  
Thickness Determination

Multivariate analysis of PIXE + XRF and PIXE spectral images

2021 ◽  
Author(s):  
Iva Božičević Mihalić ◽  
Stjepko Fazinić ◽  
Marko Barac ◽  
Andreas Germanos Karydas ◽  
Alessandro Migliori ◽  
...  
Keyword(s):  
Multivariate Analysis ◽  
Layer Thickness ◽  
X Ray ◽  
Elemental Concentrations ◽  
Thickness Determination ◽  
Multivariate T

Multivariate t-SNE analysis enables pixel identification with similar X-ray spectra for layer thickness determination and calculation of elemental concentrations.

Quantitative x-ray microanalysis and thickness determination using ζ factor

1996 ◽  
Vol 54 ◽  
pp. 580-581
Author(s):  
M. Watanabe ◽  
Z. Horita ◽  
M. Nemoto
Keyword(s):  
Diffusion Couple ◽  
Extrapolation Method ◽  
Thin Specimen ◽  
Beam Position ◽  
X Ray ◽  
Thickness Determination ◽  
Experimental Limitation ◽  
X Ray Absorption

X-ray absorption in quantitative x-ray microanalysis of thin specimens may be corrected without knowledge of thickness when the extrapolation method or the differential x-ray absorption (DXA) method is used. However, there is an experimental limitation involved in each method. In this study, a method is proposed to overcome such a limitation. The method is developed by introducing the ζ factor and by combining the extrapolation method and DXA method. The method using the ζ factor, which is called the ζ-DXA method in this study, is applied to diffusion-couple experiments in the Ni-Al system.For a thin specimen where incident electrons are fully transparent, the characteristic x-ray intensity generated from a beam position, I, may be represented as I = (NρW/A)Qωaist.

scholarly journals Irregular Electrodeposition of Cu-Sn Alloy Coatings in [EMIM]Cl Outside the Glove Box with Large Layer Thickness

Coatings ◽  
2021 ◽  
Vol 11 (3) ◽  
pp. 310
Author(s):  
Lars Lehmann ◽  
Dominik Höhlich ◽  
Thomas Mehner ◽  
Thomas Lampke
Keyword(s):  
Layer Thickness ◽  
Alloy System ◽  
Liquid Solution ◽  
Complexing Agents ◽  
X Ray Diffraction ◽  
X Ray ◽  
Argon Stream ◽  
Ionic Liquid Solution ◽  
The Relationship ◽  
Layer Composition

Thick Cu−Sn alloy layers were produced in an [EMIM]Cl ionic-liquid solution from CuCl2 and SnCl2 in different ratios. All work, including the electrodeposition, took place outside the glovebox with a continuous argon stream over the electrolyte at 95 °C. The layer composition and layer thickness can be adjusted by the variation of the metal-salts content in the electrolyte. A layer with a thickness of up to 15 µm and a copper content of up to ωCu = 0.86 was obtained. The phase composition was characterized by scanning electron microscopy (SEM), X-ray diffraction (XRD), and X-ray fluorescence (XRF). Furthermore, it was found that the relationship between the alloy composition and the concentration of the ions in the electrolyte is described as an irregular alloy system as according to Brenner. Brenner described such systems only for aqueous electrolytes containing complexing agents such as cyanide. In this work, it was confirmed that irregular alloy depositions also occur in [EMIM]Cl.

Application of Cr Kα X-ray photoelectron spectroscopy system to overlayer thickness determination

2011 ◽  
Vol 43 (13) ◽  
pp. 1632-1635 ◽  
Author(s):  
Masaaki Kobata ◽  
Igor Píš ◽  
Hiroshi Nohira ◽  
Hideo Iwai ◽  
Keisuke Kobayashi
Keyword(s):  
Photoelectron Spectroscopy ◽  
X Ray ◽  
Thickness Determination ◽  
Spectroscopy System

scholarly journals Layer Thickness Determination

2015 ◽  
Vol 10 (4) ◽  
pp. 54-56 ◽  
Author(s):  
Faiza Houta ◽  
Michael Quinten
Keyword(s):  
Layer Thickness ◽  
Thickness Determination
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