Advances in X-Ray Analysis
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79
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Published By Springer US

9781461365327, 9781461534600
Latest Documents Most Cited Documents Contributed Authors Related Sources Related Keywords

Evaluation of a Combined Transmission and Scattering Approach to Composition Imaging of Industrial Samples

1992 ◽  
pp. 1235-1241
Author(s):  
T. H. Prettyman ◽  
R. P. Gardner ◽  
J. C. Russ ◽  
K. Verghese
Keyword(s):  
Industrial Samples

The Local Structure of Chromium(III) in the Mixed Glycerol Aqueous Solution

1992 ◽  
pp. 1197-1203
Author(s):  
T. Watanabe ◽  
K. Taniguchi ◽  
T. Ninomiya ◽  
S. Ikeda
Keyword(s):  
Aqueous Solution ◽  
Local Structure

Micro-X-Ray Fluorescence Analysis on a Synchrotron Radiation Wiggler Beam Line

1992 ◽  
pp. 995-1000 ◽  
Author(s):  
J. V. Gilfrich ◽  
E. F. Skelton ◽  
S. B. Qadri ◽  
N. E. Moulton ◽  
D. J. Nagel ◽  
...  
Keyword(s):  
Synchrotron Radiation ◽  
Fluorescence Analysis ◽  
Beam Line ◽  
X Ray

Variability of Crystal Performance in X-Ray Fluorescence Spectrometers

1992 ◽  
pp. 981-985
Author(s):  
Jules V. Dubrawski ◽  
Ken E. Turner
Keyword(s):  
X Ray

An Integrated X-Ray Tube - Polarizer EDXRF-Spectrometer in Cartesian Geometry

1992 ◽  
pp. 975-980 ◽  
Author(s):  
Robert Rieder ◽  
Peter Wobrauschek ◽  
Hannes Aiginger
Keyword(s):  
X Ray ◽  
Cartesian Geometry

Light Element Analysis with TXRF

1992 ◽  
pp. 947-952 ◽  
Author(s):  
Christina Streli ◽  
Peter Wobrauschek ◽  
Hannes Aiginger
Keyword(s):  
Light Element ◽  
Element Analysis
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