Ion scattering spectroscopy studies of zirconium dioxide thin films preparedin situ

1987 ◽  
Vol 10 (1) ◽  
pp. 13-16 ◽  
Author(s):  
P. J. Martin ◽  
R. P. Netterfield
Keyword(s):  
Thin Films ◽  
Zirconium Dioxide ◽  
Ion Scattering ◽  
Ion Scattering Spectroscopy ◽  
Spectroscopy Studies

Hydrogen Adsorption Effects on Thin Film Growth Mode Studied by Ion Scattering

1991 ◽  
Vol 237 ◽  
Author(s):  
F. ShojiK ◽  
K. Sumitomo ◽  
T. Kinoshita ◽  
Y. Tanaka ◽  
K. Oura ◽  
...  
Keyword(s):  
Thin Films ◽  
Growth Process ◽  
Hydrogen Adsorption ◽  
Film Growth ◽  
Low Energy ◽  
Ion Scattering ◽  
Detection Analysis ◽  
Low Energy Ion Scattering ◽  
Flight Mode ◽  
Ion Scattering Spectroscopy

ABSTRACTThe effects of hydrogen adsorption on the growth process and structures of Ag thin films on Si(111)-7×7 surfaces has been studied. The growth process and film structures are investigated by low energy electron diffraction(LEED) and low energy ion scattering spectroscopy of time of flight mode(TOF-ICISS). The hydrogen adsorbed on the surface is investigated by low energy recoil detection analysis(TOF-ERDA). We have found that Ag thin films deposited onto hydrogen covered Si(111) surfaces grow with a mode definitely different from that on clean surfaces.

In situ determination of the terminating layer of La0.7Sr0.3MnO3 thin films using coaxial impact-collision ion scattering spectroscopy

1998 ◽  
Vol 73 (2) ◽  
pp. 187-189 ◽  
Author(s):  
M. Yoshimoto ◽  
H. Maruta ◽  
T. Ohnishi ◽  
K. Sasaki ◽  
H. Koinuma
Keyword(s):  
Thin Films ◽  
Ion Scattering ◽  
Ion Scattering Spectroscopy

Surface structure and metal epitaxy: Ag/Cu(111)

2000 ◽  
Vol 648 ◽  
Author(s):  
Kenji Umezawa ◽  
Shigemitsu Nakanishi ◽  
Walter M. Gibson
Keyword(s):  
Thin Films ◽  
Substrate Temperature ◽  
Solid Surfaces ◽  
Growth Mode ◽  
Ion Scattering ◽  
General Phenomenon ◽  
Growth Modes ◽  
Ion Scattering Spectroscopy ◽  
Different Types ◽  
Substrate Temperatures

AbstractWe have investigated the growth of 3 ML (mono-layer) of Ag on Cu(111) for substrate temperatures from 170 through 640 K by using time of flight-impact collision ion scattering spectroscopy (TOF -ICISS). Two different types of epitaxial growth exist: Ag [112]//Cu[112](type-n) and Ag [112]//Cu[112] (type-r).The growth modes of the Ag thin films on Cu(111) surfaces depend strongly on the temperature during deposition with the Ag(111) planes having a preferred orientation of either type-n growth mode or type-r growth mode as a function of theCu substrate temperature. The experimental results concerning Ag/Cu(111) show many similarities to those in the previous study of Au/Ni(111). This would suggest that an observed oscillation in the growth mode, dependent on the substrate temperature during deposition may a general phenomenon on solid surfaces, in cases of large misfit since it has now been seen for both Au/Ni(111) and Ag/Cu(111) systems.

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