Hydrogen Adsorption Effects on Thin Film Growth Mode Studied by Ion Scattering
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ABSTRACTThe effects of hydrogen adsorption on the growth process and structures of Ag thin films on Si(111)-7×7 surfaces has been studied. The growth process and film structures are investigated by low energy electron diffraction(LEED) and low energy ion scattering spectroscopy of time of flight mode(TOF-ICISS). The hydrogen adsorbed on the surface is investigated by low energy recoil detection analysis(TOF-ERDA). We have found that Ag thin films deposited onto hydrogen covered Si(111) surfaces grow with a mode definitely different from that on clean surfaces.
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1986 ◽
Vol 100
(2)
◽
pp. 500-502
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1984 ◽
Vol 2
(2)
◽
pp. 635-636
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