All in situ deposition and characterization of YBa2Cu3O7−x thin films by low‐energy ion scattering spectroscopy

1995 ◽  
Vol 66 (24) ◽  
pp. 3362-3364 ◽  
Author(s):  
T. Nakamura ◽  
S. Tanaka ◽  
M. Iiyama
Keyword(s):  
Thin Films ◽  
Low Energy ◽  
Ion Scattering ◽  
Low Energy Ion Scattering ◽  
In Situ Deposition ◽  
Ion Scattering Spectroscopy

Hydrogen Adsorption Effects on Thin Film Growth Mode Studied by Ion Scattering

1991 ◽  
Vol 237 ◽  
Author(s):  
F. ShojiK ◽  
K. Sumitomo ◽  
T. Kinoshita ◽  
Y. Tanaka ◽  
K. Oura ◽  
...  
Keyword(s):  
Thin Films ◽  
Growth Process ◽  
Hydrogen Adsorption ◽  
Film Growth ◽  
Low Energy ◽  
Ion Scattering ◽  
Detection Analysis ◽  
Low Energy Ion Scattering ◽  
Flight Mode ◽  
Ion Scattering Spectroscopy

ABSTRACTThe effects of hydrogen adsorption on the growth process and structures of Ag thin films on Si(111)-7×7 surfaces has been studied. The growth process and film structures are investigated by low energy electron diffraction(LEED) and low energy ion scattering spectroscopy of time of flight mode(TOF-ICISS). The hydrogen adsorbed on the surface is investigated by low energy recoil detection analysis(TOF-ERDA). We have found that Ag thin films deposited onto hydrogen covered Si(111) surfaces grow with a mode definitely different from that on clean surfaces.

In-Situ Measurement ofHe+Stopping in Si Layers by Low-Energy Ion-Scattering Spectroscopy

1996 ◽  
Vol 35 (Part 1, No. 3) ◽  
pp. 1937-1939 ◽  
Author(s):  
Miyako Matsui ◽  
Fumihiko Uchida ◽  
Kiyokazu Nakagawa ◽  
Akio Nishida
Keyword(s):  
Low Energy ◽  
In Situ Measurement ◽  
Ion Scattering ◽  
Low Energy Ion Scattering ◽  
Ion Scattering Spectroscopy

scholarly journals Oxidation of metal thin films by atomic oxygen: A low energy ion scattering study

2019 ◽  
Vol 126 (15) ◽  
pp. 155301 ◽  
Author(s):  
C. R. Stilhano Vilas Boas ◽  
J. M. Sturm ◽  
F. Bijkerk
Keyword(s):  
Thin Films ◽  
Atomic Oxygen ◽  
Low Energy ◽  
Ion Scattering ◽  
Metal Thin Films ◽  
Low Energy Ion Scattering ◽  
Scattering Study

In situ observations of Ge(001) and Ge/Si(001) using low‐energy ion scattering

1994 ◽  
Vol 12 (6) ◽  
pp. 3012-3017 ◽  
Author(s):  
W. T. Taferner ◽  
A. Freundlich ◽  
A. Bensaoula ◽  
A. Ignatiev ◽  
Kelley Waters ◽  
...  
Keyword(s):  
Low Energy ◽  
Ion Scattering ◽  
Low Energy Ion Scattering ◽  
In Situ Observations
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