Surface structure of cationic surfactant solutions investigated by angular resolved X-ray photoelectron spectroscopy with calibrated transmission function

2011 ◽  
Vol 43 (4) ◽  
pp. 784-790 ◽  
Author(s):  
Chuangye Wang ◽  
Harald Morgner
1989 ◽  
Vol 163 ◽  
Author(s):  
Yoshihisa Fujisaki ◽  
Shigeo Goto

AbstractSurface structure of (NH4)2S treated GaAs. is investigated using PL (PhotoLuminescence), XPS (X-ray Photoelectron Spectroscopy) and RHEED (Reflection of High Energy Electron beam Diffraction). The data taken with these techniques show the strong dependence upon the crystal orientations coming from the stabilities of chemical bonds of Ga-S and As-S on GaAs crystals. The greater enhancement of PL intensity, the clearer RHEED patterns and the smaller amount of oxides on (111)A than (111)B implies the realization of a more stable structure composed mainly of the Ga-S chemical bond.


1998 ◽  
Vol 4 (4) ◽  
pp. 257-266 ◽  
Author(s):  
Bobby G. Russell ◽  
William E. Moddeman ◽  
Janine C. Birkbeck ◽  
Stephen E. Wright ◽  
David S. Millington ◽  
...  

2010 ◽  
Vol 43 (11) ◽  
pp. 1371-1376
Author(s):  
Hyun Ook Seo ◽  
Jaeyoung Lee ◽  
Kwang-Dae Kim ◽  
Yuan Luo ◽  
Nilay Kumar Dey ◽  
...  

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