Interface analysis and compositional depth profiling by XPS of polymer coatings prepared using ultra-low-angle microtomy

Steven J. Hinder; John F. Watts; Chris Lowe

doi:10.1002/sia.1830

Interface analysis and compositional depth profiling by XPS of polymer coatings prepared using ultra-low-angle microtomy

Surface and Interface Analysis ◽

10.1002/sia.1830 ◽

2004 ◽

Vol 36 (8) ◽

pp. 1032-1036 ◽

Cited By ~ 25

Author(s):

Steven J. Hinder ◽

John F. Watts ◽

Chris Lowe

Keyword(s):

Depth Profiling ◽

Polymer Coatings ◽

Interface Analysis ◽

Compositional Depth Profiling

Download Full-text

Low temperature plasma for the preparation of crater walls for compositional depth profiling of thin inorganic multilayers

Surface and Interface Analysis ◽

10.1002/sia.6187 ◽

2016 ◽

Vol 49 (6) ◽

pp. 515-521

Author(s):

Shin Muramoto ◽

Joe Bennett

Keyword(s):

Low Temperature ◽

Depth Profiling ◽

Low Temperature Plasma ◽

Temperature Plasma ◽

Compositional Depth Profiling

Download Full-text

COMPOSITIONAL DEPTH PROFILING IN SOLAR ENERGY MATERIALS USING MEV ION BEAM ANALYSIS

Solar Optical Materials ◽

10.1016/b978-0-08-036613-5.50022-5 ◽

1988 ◽

pp. 173-180

Author(s):

C Jeynes

Keyword(s):

Solar Energy ◽

Ion Beam ◽

Depth Profiling ◽

Energy Materials ◽

Ion Beam Analysis ◽

Solar Energy Materials ◽

Beam Analysis ◽

Compositional Depth Profiling

Download Full-text

Composition-Depth profiling and interface analysis of surface coatings using ball cratering and the scanning auger microprobe

Surface and Interface Analysis ◽

10.1002/sia.740010607 ◽

1979 ◽

Vol 1 (6) ◽

pp. 204-210 ◽

Cited By ~ 72

Author(s):

J. M. Walls ◽

D. D. Hall ◽

D. E. Sykes

Keyword(s):

Depth Profiling ◽

Surface Coatings ◽

Interface Analysis ◽

Scanning Auger Microprobe

Download Full-text

Quantitative compositional depth profiling of Si1−x−yGexCy thin films by simultaneous elastic recoil detection and Rutherford backscattering spectrometry

Nuclear Instruments and Methods in Physics Research Section B Beam Interactions with Materials and Atoms ◽

10.1016/s0168-583x(97)00881-1 ◽

1998 ◽

Vol 136-138 ◽

pp. 654-660 ◽

Cited By ~ 1

Author(s):

S.C. Gujrathi ◽

S. Roorda ◽

J.G. D'Arcy ◽

Randall J. Pflueger ◽

P. Desjardins ◽

...

Keyword(s):

Thin Films ◽

Rutherford Backscattering Spectrometry ◽

Depth Profiling ◽

Rutherford Backscattering ◽

Elastic Recoil ◽

Elastic Recoil Detection ◽

Compositional Depth Profiling

Download Full-text

High resolution compositional depth profiling

Journal of Vacuum Science & Technology A Vacuum Surfaces and Films ◽

10.1116/1.577647 ◽

1991 ◽

Vol 9 (3) ◽

pp. 1466-1476 ◽

Cited By ~ 42

Author(s):

S. Hofmann

Keyword(s):

High Resolution ◽

Depth Profiling ◽

Compositional Depth Profiling

Download Full-text

Calibration for compositional depth profiling

RSC Analytical Spectroscopy Series - Glow Discharge Optical Emission Spectroscopy ◽

10.1039/9781847550989-00082 ◽

2007 ◽

pp. 82-102

Keyword(s):

Depth Profiling ◽

Compositional Depth Profiling

Download Full-text

Compositional Depth Profiling

An Introduction to Surface Analysis by XPS and AES ◽

10.1002/9781119417651.ch4 ◽

2019 ◽

pp. 97-134

Keyword(s):

Depth Profiling ◽

Compositional Depth Profiling

Download Full-text

Surface chemical analysis. General procedures for quantitative compositional depth profiling by glow discharge optical emission spectrometry

10.3403/30255192u ◽

2015 ◽

Keyword(s):

Glow Discharge ◽

Chemical Analysis ◽

Depth Profiling ◽

Optical Emission ◽

Optical Emission Spectrometry ◽

Emission Spectrometry ◽

Surface Chemical ◽

Compositional Depth Profiling ◽

Surface Chemical Analysis

Download Full-text

Surface chemical analysis. General procedures for quantitative compositional depth profiling by glow discharge optical emission spectrometry

10.3403/30255192 ◽

2013 ◽

Keyword(s):

Glow Discharge ◽

Chemical Analysis ◽

Depth Profiling ◽

Optical Emission ◽

Optical Emission Spectrometry ◽

Emission Spectrometry ◽

Surface Chemical ◽

Compositional Depth Profiling ◽

Surface Chemical Analysis

Download Full-text

Effect of C60 ion sputtering on the compositional depth profiling in XPS for Li(Ni,Co,Mn)O2 electrodes

Applied Surface Science ◽

10.1016/j.apsusc.2011.08.087 ◽

2011 ◽

Vol 258 (3) ◽

pp. 1279-1281 ◽

Cited By ~ 7

Author(s):

Li-Shin Chang ◽

Yi-Chun Lin ◽

Ching-Yi Su ◽

Hung-Chun Wu ◽

Jing-Pin Pan

Keyword(s):

Depth Profiling ◽

Ion Sputtering ◽

Compositional Depth Profiling

Download Full-text