Effect of C60 ion sputtering on the compositional depth profiling in XPS for Li(Ni,Co,Mn)O2 electrodes

Li-Shin Chang; Yi-Chun Lin; Ching-Yi Su; Hung-Chun Wu; Jing-Pin Pan

doi:10.1016/j.apsusc.2011.08.087

Effect of C60 ion sputtering on the compositional depth profiling in XPS for Li(Ni,Co,Mn)O2 electrodes

Applied Surface Science ◽

10.1016/j.apsusc.2011.08.087 ◽

2011 ◽

Vol 258 (3) ◽

pp. 1279-1281 ◽

Cited By ~ 7

Author(s):

Li-Shin Chang ◽

Yi-Chun Lin ◽

Ching-Yi Su ◽

Hung-Chun Wu ◽

Jing-Pin Pan

Keyword(s):

Depth Profiling ◽

Ion Sputtering ◽

Compositional Depth Profiling

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Low temperature plasma for the preparation of crater walls for compositional depth profiling of thin inorganic multilayers

Surface and Interface Analysis ◽

10.1002/sia.6187 ◽

2016 ◽

Vol 49 (6) ◽

pp. 515-521

Author(s):

Shin Muramoto ◽

Joe Bennett

Keyword(s):

Low Temperature ◽

Depth Profiling ◽

Low Temperature Plasma ◽

Temperature Plasma ◽

Compositional Depth Profiling

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Compositional analysis of surface and interface. Depth profiling analysis using ion sputtering.

Nihon Kessho Gakkaishi ◽

10.5940/jcrsj.29.87 ◽

1987 ◽

Vol 29 (2) ◽

pp. 87-92 ◽

Cited By ~ 1

Author(s):

KAZUO KAJIWARA

Keyword(s):

Depth Profiling ◽

Compositional Analysis ◽

Ion Sputtering ◽

Surface And Interface ◽

Profiling Analysis

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Measurement of Ion Sputtering Yields for In-depth Profiling Analysis

Tetsu-to-Hagane ◽

10.2355/tetsutohagane1955.77.12_2171 ◽

1991 ◽

Vol 77 (12) ◽

pp. 2171-2178 ◽

Cited By ~ 2

Author(s):

Toshiko SUZUKI ◽

Kichinosuke HIROKAWA ◽

Yasuo FUKUDA ◽

Kenichi SUZUKI ◽

Satoshi HASHIMOTO ◽

...

Keyword(s):

Depth Profiling ◽

Ion Sputtering ◽

Sputtering Yields ◽

Profiling Analysis

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COMPOSITIONAL DEPTH PROFILING IN SOLAR ENERGY MATERIALS USING MEV ION BEAM ANALYSIS

Solar Optical Materials ◽

10.1016/b978-0-08-036613-5.50022-5 ◽

1988 ◽

pp. 173-180

Author(s):

C Jeynes

Keyword(s):

Solar Energy ◽

Ion Beam ◽

Depth Profiling ◽

Energy Materials ◽

Ion Beam Analysis ◽

Solar Energy Materials ◽

Beam Analysis ◽

Compositional Depth Profiling

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Quantitative compositional depth profiling of Si1−x−yGexCy thin films by simultaneous elastic recoil detection and Rutherford backscattering spectrometry

Nuclear Instruments and Methods in Physics Research Section B Beam Interactions with Materials and Atoms ◽

10.1016/s0168-583x(97)00881-1 ◽

1998 ◽

Vol 136-138 ◽

pp. 654-660 ◽

Cited By ~ 1

Author(s):

S.C. Gujrathi ◽

S. Roorda ◽

J.G. D'Arcy ◽

Randall J. Pflueger ◽

P. Desjardins ◽

...

Keyword(s):

Thin Films ◽

Rutherford Backscattering Spectrometry ◽

Depth Profiling ◽

Rutherford Backscattering ◽

Elastic Recoil ◽

Elastic Recoil Detection ◽

Compositional Depth Profiling

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High resolution compositional depth profiling

Journal of Vacuum Science & Technology A Vacuum Surfaces and Films ◽

10.1116/1.577647 ◽

1991 ◽

Vol 9 (3) ◽

pp. 1466-1476 ◽

Cited By ~ 42

Author(s):

S. Hofmann

Keyword(s):

High Resolution ◽

Depth Profiling ◽

Compositional Depth Profiling

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Calibration for compositional depth profiling

RSC Analytical Spectroscopy Series - Glow Discharge Optical Emission Spectroscopy ◽

10.1039/9781847550989-00082 ◽

2007 ◽

pp. 82-102

Keyword(s):

Depth Profiling ◽

Compositional Depth Profiling

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Compositional Depth Profiling

An Introduction to Surface Analysis by XPS and AES ◽

10.1002/9781119417651.ch4 ◽

2019 ◽

pp. 97-134

Keyword(s):

Depth Profiling ◽

Compositional Depth Profiling

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Surface chemical analysis. General procedures for quantitative compositional depth profiling by glow discharge optical emission spectrometry

10.3403/30255192u ◽

2015 ◽

Keyword(s):

Glow Discharge ◽

Chemical Analysis ◽

Depth Profiling ◽

Optical Emission ◽

Optical Emission Spectrometry ◽

Emission Spectrometry ◽

Surface Chemical ◽

Compositional Depth Profiling ◽

Surface Chemical Analysis

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Surface chemical analysis. General procedures for quantitative compositional depth profiling by glow discharge optical emission spectrometry

10.3403/30255192 ◽

2013 ◽

Keyword(s):

Glow Discharge ◽

Chemical Analysis ◽

Depth Profiling ◽

Optical Emission ◽

Optical Emission Spectrometry ◽

Emission Spectrometry ◽

Surface Chemical ◽

Compositional Depth Profiling ◽

Surface Chemical Analysis

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