Recombination dynamics in InGaN/GaN quantum wells: role of the piezoelectric field versus carrier localization

2004 ◽  
Vol 1 (6) ◽  
pp. 1397-1402 ◽  
Author(s):  
A. Vinattieri ◽  
M. Colocci ◽  
F. Rossi ◽  
C. Ferrari ◽  
N. Armani ◽  
...  
2001 ◽  
Vol 188 (2) ◽  
pp. 851-855 ◽  
Author(s):  
D. Alderighi ◽  
A. Vinattieri ◽  
J. Kudrna ◽  
M. Colocci ◽  
A. Reale ◽  
...  

2007 ◽  
Vol 1040 ◽  
Author(s):  
Pavel Bokov ◽  
Lev Avakyants ◽  
Mansur Badgutdinov ◽  
Anatoly Chervyakov ◽  
Stanislav Shirokov ◽  
...  

AbstractThe influence of built in piezoelectric field in the light-emitting diodes based on InGaN/AlGaN/GaN heterostructures on the electroreflectance spectra have been studied. The structures were grown by MOCVD technology and «flip-chip» mounted. Light was emitted or reflected through sapphire substrate. The built in electric field in the structure was modulated by pulses of reverse bias from -6 to +1 V applied to the contacts of diode. Observed blue shift of spectral line from InGaN/GaN multiply quantum wells region with the increasing reverse bias voltage has been explained as the result of lowering of the electric field in the quantum well.


2001 ◽  
Vol 78 (5) ◽  
pp. 640-642 ◽  
Author(s):  
G. Vaschenko ◽  
D. Patel ◽  
C. S. Menoni ◽  
S. Keller ◽  
U. K. Mishra ◽  
...  

2021 ◽  
Vol 11 (1) ◽  
Author(s):  
Agata Bojarska-Cieślińska ◽  
Łucja Marona ◽  
Julita Smalc-Koziorowska ◽  
Szymon Grzanka ◽  
Jan Weyher ◽  
...  

AbstractIn this work we investigate the role of threading dislocations in nitride light emitters with different indium composition. We compare the properties of laser diodes grown on the low defect density GaN substrate with their counterparts grown on sapphire substrate in the same epitaxial process. All structures were produced by metalorganic vapour phase epitaxy and emit light in the range 383–477 nm. We observe that intensity of electroluminescence is strong in the whole spectral region for devices grown on GaN, but decreases rapidly for the devices on sapphire and emitting at wavelength shorter than 420 nm. We interpret this behaviour in terms of increasing importance of dislocation related nonradiative recombination for low indium content structures. Our studies show that edge dislocations are the main source of nonradiative recombination. We observe that long wavelength emitting structures are characterized by higher average light intensity in cathodoluminescence and better thermal stability. These findings indicate that diffusion path of carriers in these samples is shorter, limiting the amount of carriers reaching nonradiative recombination centers. According to TEM images only mixed dislocations open into the V-pits, usually above the multi quantum wells thus not influencing directly the emission.


2021 ◽  
Vol 13 (6) ◽  
pp. 7476-7484
Author(s):  
Julita Smalc-Koziorowska ◽  
Ewa Grzanka ◽  
Artur Lachowski ◽  
Roman Hrytsak ◽  
Mikolaj Grabowski ◽  
...  

2016 ◽  
Vol 108 (8) ◽  
pp. 082103 ◽  
Author(s):  
S. Azaizia ◽  
A. Balocchi ◽  
H. Carrère ◽  
P. Renucci ◽  
T. Amand ◽  
...  

2001 ◽  
Vol 79 (10) ◽  
pp. 1483-1485 ◽  
Author(s):  
S. P. Łepkowski ◽  
H. Teisseyre ◽  
T. Suski ◽  
P. Perlin ◽  
N. Grandjean ◽  
...  

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