A Novel Technique to Investigate the Role of Traps in the Off‐State Performance of AlGaN/GaN High Electron Mobility Transistor on Si Using Substrate Bias
2007 ◽
Vol 37
(5)
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pp. 550-553
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Keyword(s):
2016 ◽
Vol 64
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pp. 589-593
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2017 ◽
Vol 214
(7)
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pp. 1600944
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1998 ◽
Vol 31
(2)
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pp. 159-164
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2006 ◽
Vol 45
(No. 35)
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pp. L932-L934
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2004 ◽
Vol 43
(12)
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pp. 8019-8023
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