Thermal Transient Extraction for GaN HEMTs by Frequency-Resolved Gate Resistance Thermometry with Sub-100 ns Time Resolution
Keyword(s):
2017 ◽
Vol 64
(1)
◽
pp. 78-83
◽
2019 ◽
Vol 66
(1)
◽
pp. 330-336
◽
2017 ◽
Vol 38
(2)
◽
pp. 240-243
◽
1994 ◽
Vol 144
◽
pp. 431-434
Keyword(s):
2000 ◽
Vol 179
◽
pp. 197-200
2018 ◽