Effects of post-annealing temperature on carbon incorporated amorphous indium–zinc-oxide thin-film transistors fabrication using sputtering at room temperature
2019 ◽
Vol 19
(10)
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pp. 6170-6173
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2016 ◽
Vol 16
(12)
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pp. 12871-12874
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2017 ◽
Vol 56
(4S)
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pp. 04CG06
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2015 ◽
Vol 32
(8)
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pp. 088506
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2019 ◽
Vol 30
(14)
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pp. 12929-12936
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