scholarly journals Characterization of local Al-contacts by light beam induced current measurements and their verification by 2D simulation using flexPDE

2016 ◽  
Vol 213 (5) ◽  
pp. 1317-1323 ◽  
Author(s):  
Renate Horbelt ◽  
Gabriel Micard ◽  
Philipp Keller ◽  
Giso Hahn ◽  
Reinhart Job ◽  
...  
Keyword(s):  
Light Beam ◽  
Induced Current ◽  
2D Simulation

Grain boundary light beam induced current: A characterization of bonded silicon wafers and polycrystalline silicon thin films for diffusion length extraction

2016 ◽  
Vol 213 (7) ◽  
pp. 1728-1737 ◽  
Author(s):  
Orman Gref ◽  
Ana-Maria Teodoreanu ◽  
Rainer Leihkauf ◽  
Heiko Lohrke ◽  
Martin Kittler ◽  
...  
Keyword(s):  
Thin Films ◽  
Grain Boundary ◽  
Light Beam ◽  
Polycrystalline Silicon ◽  
Diffusion Length ◽  
Silicon Wafers ◽  
Induced Current ◽  
Silicon Thin Films
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